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Time & frequency metrology

News and Updates

Jun Ye: A Timely Profile

Physicist Jun Ye has a knack for making every second count—literally. At JILA, a joint research institute of the University of Colorado and the National

Projects and Programs

Phase and Amplitude Noise Calibration Services

Ongoing
The primary responsibility of the Phase Noise Metrology Group is to develop and provide calibration services for industrial, military, and commercial organizations to support the core mission of NIST. The PM and AM noise measurements require traceability and certification of devices such as phase

Phase and Amplitude Noise Metrology

Ongoing
The group provides high-precision measurement of electromagnetic signals in the radio-frequency, microwave and optical range. These measurements include phase noise, amplitude noise and perturbations due to vibration and temperature. Such precision measurements support high-value applications such

Field Programmable Gate Array (FPGA) Designs for Metrology

Ongoing
Until recently, the precision measurement of phase noise, spectral purity, and related quantities had been a challenging process, with only a handful of qualified experts in the world. However, Field Programmable Gate Array (FPGA) based measurement systems, similar to software defined radio (SDR)

Low-Phase Noise Frequency Synthesis

Ongoing
Frequency synthesis plays an essential role in virtually all present-day commercial, industrial, and military technologies. State-of-the-art low-noise frequency synthesis is a crucial technical asset to high-resolution imaging and radar, high-speed telecommunications, and efficient management of the

Publications

Wavemeter calibration by frequency comb

Author(s)
Patrick Egan
Upgrades to the vacuum-wavelength calibration service at NIST are reported. The instrumentation centerpiece is an optical frequency comb tied to a GPS

Foundry manufacturing of octave-spanning microcombs

Author(s)
Jizhao Zang, Haixin Liu, Travis Briles, Scott Papp
Soliton microcombs provide a chip-based, octave-spanning source for self-referencing and optical metrology. We use a silicon nitride integrated photonics

Awards