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Industries may use "condition monitoring systems" (CMS) to monitor machines and enterprises – like production lines – for detrimental or unexpected changes in
Defective computer chips are the bane of the semiconductor industry. Even a seemingly minor flaw in a chip packed with billions of electrical connections might
Cutting intricate patterns as small as several billionths of a meter deep and wide, the focused ion beam (FIB) is an essential tool for deconstructing and
The Digital Thread for Manufacturing project will deliver methods, protocols, and tools for developing, conformance testing, increasing user-awareness, and
Critical parts for defense, aerospace, and medical applications must be formally qualified prior to use. Currently, extensive empirical testing consisting of
Part quality in additive manufacturing (AM) is highly dependent on the process control, but there is a lack of adequate AM control methods and standards. In
AM data is essential for establishing part traceability, understanding AM processes and making decisions during the product development lifecycle. The curation
Ward L. Johnson, Jake Benzing, Orion Kafka, Newell Moser, Derek Harris, Jeremy Iten, Nik Hrabe
Acoustic nonlinearity and loss are found to be positively correlated with porosity at industrially relevant levels of less than half a percent in commercially
Chuck Barber, Colleen E. Bryan Sallee, Carolyn Burdette, Shaun Kotoski, Melissa M. Phillips, Walter Brent Wilson, Laura Wood
In 2020, NIST launched CannaQAP to improve the comparability of the analytical measurements of cannabis and cannabis-derived products in forensic and cannabis
Papa Amoah, Joseph J. Kopanski, Yaw S. Obeng, Christopher Sunday, Chukwudi Okoro, Lin You, Dmirty Veksler
In this paper, we present an overview of our current research focus in developing non-destructive metrology for monitoring reliability issues in 3D-integrated
Dianne L. Poster, C Cameron Miller, Yaw S. Obeng, John J. Kasianowicz, Michael T. Postek, Norman Horn, Troy Cowan, Richard Martinello
The development of an international, precompetitive, collaborative, ultraviolet (UV) research consortium is discussed as an opportunity to lay the groundwork