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X-Ray and Neutron Reflectivity Measurements of Moisture Transport Through Model Multilayered Barrier Films for Oled Applications

Published

Author(s)

B D. Vogt, V. J. Lee, Vivek Prabhu, Dean DeLongchamp, Eric K. Lin, Wen-Li Wu
Citation
Journal of Applied Physics
Volume
97

Keywords

Electronic Materials, Nanostructured Materials, Reflectivity, Thin Films, interfaces, moisture barrier, reflectivity, thin films

Citation

Vogt, B. , Lee, V. , Prabhu, V. , DeLongchamp, D. , Lin, E. and Wu, W. (2005), X-Ray and Neutron Reflectivity Measurements of Moisture Transport Through Model Multilayered Barrier Films for Oled Applications, Journal of Applied Physics, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=853976 (Accessed April 16, 2024)
Created December 31, 2004, Updated October 12, 2021