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Workshop on Enhancing Security of Devices and Components Across the Supply Chain
Published
Author(s)
Sanjay Rekhi, David Kuhn, Kim Schaffer, Murugiah Souppaya, Noah Waller, Nelson Hastings, Michael Ogata, William Barker
Abstract
NIST hosted an in-person, all-day workshop on February 27, 2024, to discuss existing and emerging cybersecurity threats and mitigation techniques for semiconductors throughout their life cycle. The workshop obtained valuable feedback from industry, academia, and government to inform NIST's development of cybersecurity and supply chain standards, guidance, and recommended practices. The discussion focused on semiconductor development and highlighted cybersecurity measurements and metrics that utilize reference data sets to facilitate the testing, attestation, certification, verification, and validation of semiconductor components. It also emphasized the use of automated cybersecurity tools and techniques to secure manufacturing environments throughout the development life cycle. This report summarizes the content that was presented and discussed at the workshop.
Rekhi, S.
, Kuhn, D.
, Schaffer, K.
, Souppaya, M.
, Waller, N.
, Hastings, N.
, Ogata, M.
and Barker, W.
(2025),
Workshop on Enhancing Security of Devices and Components Across the Supply Chain, NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.IR.8532, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=959182
(Accessed October 9, 2025)