NIST has developed the capability to measure noise parameters on a wafer int he 1-12.4 GHz range. In this paper we briefly describe the measurement methods and the uncertainty analysis and present results of measurements on a very poorly matched transistor.
Conference Dates: July 9-14, 2006
Conference Location: Turin, IT
Conference Title: Conference on Precision Electromagnetic Measurements
Pub Type: Conferences
noise, noise measurement, noise parameter, on-wafer measurement, transistor noise