Sayan, S.
, Bartynski, R.
, Zhao, X.
, Gusev, E.
, Vanderbilt, D.
, Croft, M.
, Banaszak-Holl, M.
and Garfunkel, E.
(2004),
Valence and Conduction Band Offsets of a ZrO2/SiOxNy/n-Si CMOS Gate Stack: A Combined Photoemission and Inverse Photoemission Study, Physica Status Solidi, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=906325
(Accessed October 18, 2025)
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Valence and Conduction Band Offsets of a ZrO2/SiOxNy/n-Si CMOS Gate Stack: A Combined Photoemission and Inverse Photoemission Study
Published
Author(s)
, Robert A. Bartynski, Xin Zhao, Evgeni Gusev, David V. Vanderbilt, Mark Croft, M M. Banaszak-Holl, Eric Garfunkel
Citation
Physica Status Solidi
Volume
241
Issue
10
Pub Type
Journals
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Created April 2, 2004, Updated February 19, 2017