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Uncertainties in Electron Probe Microanalysis

Published

Author(s)

Ryna B. Marinenko, Stefan D. Leigh

Abstract

This tutorial discusses the importance of citing valid uncertainties when reporting analytical results and the need for a universally accepted approach for evaluating uncertainties. Today, the CIPM procedure has been accepted by numerous international organizations, as well as accepted and used by NIST. The basics of the CIPM approach are described and it is applied to the equations used in wavelength dispersive electron probe microanalysis quantification with an experimental example.
Proceedings Title
European Microbeam Analysis Society 2009
Volume
7
Issue
1
Conference Dates
May 10-14, 2009
Conference Location
Gdansk
Conference Title
11th European Workshop on Modern Developments and Applications in Microbeam Analysis

Keywords

"CIPM approach", "electron probe microanalysis", "microanalysis", "standard uncertainty", "uncertainty"

Citation

Marinenko, R. and Leigh, S. (2010), Uncertainties in Electron Probe Microanalysis, European Microbeam Analysis Society 2009 , Gdansk, -1 (Accessed April 21, 2024)
Created March 12, 2010, Updated June 2, 2021