McCrackin, F.
, Passaglia, E.
, Stromberg, R.
and Steinberg, H.
(2001),
Treasure of the Past VII: Measurement of the Thickness and Refractive Index of Very Thin Films and the Optical Properties of Surfaces by Ellipsometry, Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
(Accessed December 3, 2024)