Total Ionizing Dose Effects on TiN/Ti/HfO2/TiN RRAM Studied via Electrically Detected Magnetic Resonance

Published: March 29, 2018

Author(s)

Duane J. McCrory, Patrick M. Lenahan, David M. Nminibapiel, Dmitry Veksler, Jason T. Ryan, Jason P. Campbell
Citation: IEEE Transactions on Nuclear Science
Pub Type: Journals
Created March 29, 2018, Updated April 09, 2018