McCrory, D.
, Lenahan, P.
, Nminibapiel, D.
, Veksler, D.
, Ryan, J.
and Campbell, J.
(2018),
Total Ionizing Dose Effects on TiN/Ti/HfO2/TiN RRAM Studied via Electrically Detected Magnetic Resonance, IEEE Transactions on Nuclear Science
(Accessed December 13, 2024)
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Total Ionizing Dose Effects on TiN/Ti/HfO2/TiN RRAM Studied via Electrically Detected Magnetic Resonance
Published
Author(s)
Duane J. McCrory, Patrick M. Lenahan, , , ,
Citation
IEEE Transactions on Nuclear Science
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Journals
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Created March 28, 2018, Updated October 12, 2021