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PUBLICATIONS

Total Ionizing Dose Effects on TiN/Ti/HfO2/TiN RRAM Studied via Electrically Detected Magnetic Resonance

Published

Author(s)

Duane J. McCrory, Patrick M. Lenahan, David M. Nminibapiel, Dmitry Veksler, Jason Ryan, Jason Campbell
Citation
IEEE Transactions on Nuclear Science
Pub Type
Journals
Spectroscopy and Semiconductors

Citation

McCrory, D. , Lenahan, P. , Nminibapiel, D. , Veksler, D. , Ryan, J. and Campbell, J. (2018), Total Ionizing Dose Effects on TiN/Ti/HfO2/TiN RRAM Studied via Electrically Detected Magnetic Resonance, IEEE Transactions on Nuclear Science (Accessed October 13, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created March 28, 2018, Updated October 12, 2021
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