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Total Ionizing Dose Effects on TiN/Ti/HfO2/TiN RRAM Studied via Electrically Detected Magnetic Resonance

Published

Author(s)

Duane J. McCrory, Patrick M. Lenahan, David M. Nminibapiel, Dmitry Veksler, Jason Ryan, Jason Campbell
Citation
IEEE Transactions on Nuclear Science

Citation

McCrory, D. , Lenahan, P. , Nminibapiel, D. , Veksler, D. , Ryan, J. and Campbell, J. (2018), Total Ionizing Dose Effects on TiN/Ti/HfO2/TiN RRAM Studied via Electrically Detected Magnetic Resonance, IEEE Transactions on Nuclear Science (Accessed October 26, 2021)
Created March 28, 2018, Updated October 12, 2021