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Test Structure Data Classification Using a Directed Graph Approach

Published

Author(s)

Michael W. Cresswell, D. Khera, Loren W. Linholm, C. E. Schuster
Proceedings Title
Proc., IEEE International Conference on Microelectronic Test Structures
Conference Dates
March 5-7, 1990
Conference Location
San Diego, CA, USA

Citation

Cresswell, M. , Khera, D. , Linholm, L. and Schuster, C. (1990), Test Structure Data Classification Using a Directed Graph Approach, Proc., IEEE International Conference on Microelectronic Test Structures, San Diego, CA, USA (Accessed April 14, 2024)
Created December 30, 1990, Updated October 12, 2021