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PUBLICATIONS

Test Structure Data Classification Using a Directed Graph Approach

Published

Author(s)

Michael W. Cresswell, D. Khera, Loren W. Linholm, C. E. Schuster
Proceedings Title
Proc., IEEE International Conference on Microelectronic Test Structures
Conference Dates
March 5-7, 1990
Conference Location
San Diego, CA, USA
Pub Type
Conferences

Citation

Cresswell, M. , Khera, D. , Linholm, L. and Schuster, C. (1990), Test Structure Data Classification Using a Directed Graph Approach, Proc., IEEE International Conference on Microelectronic Test Structures, San Diego, CA, USA (Accessed October 17, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created December 30, 1990, Updated October 12, 2021
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