TY  - CONF
AU  - Michael Cresswell
AU  - D. Khera
AU  - Loren Linholm
AU  - C. Schuster
C2  - Proc., IEEE International Conference on Microelectronic Test Structures, San Diego, CA, USA
DA  - 1990-12-31 00:12:00
LA  - en
PB  - Proc., IEEE International Conference on Microelectronic Test Structures, San Diego, CA, USA
PY  - 1990
TI  - Test Structure Data Classification Using a Directed Graph Approach
ER  -