@conference{846081,
  author = {Michael Cresswell and D. Khera and Loren Linholm and C. Schuster},
  title = {Test Structure Data Classification Using a Directed Graph Approach},
  year = {1990},
  month = {1990-12-31 00:12:00},
  publisher = {Proc., IEEE International Conference on Microelectronic Test Structures, San Diego, CA, USA},
  language = {en},
}