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Test Circuit Structures for Characterizing the Effects of Localized Hot-Carrier-Induced Charge in VLSI Switching Circuits

Published

Author(s)

John S. Suehle, Kathleen Gallo
Conference Dates
February 22-23, 1988
Conference Location
Long Beach, CA, USA
Conference Title
IEEE International Conference on Microelectronic Test Structures

Citation

Suehle, J. and Gallo, K. (1988), Test Circuit Structures for Characterizing the Effects of Localized Hot-Carrier-Induced Charge in VLSI Switching Circuits, IEEE International Conference on Microelectronic Test Structures, Long Beach, CA, USA (Accessed April 15, 2024)
Created December 30, 1988, Updated October 12, 2021