Suehle, J.
and Gallo, K.
(1988),
Test Circuit Structures for Characterizing the Effects of Localized Hot-Carrier-Induced Charge in VLSI Switching Circuits, IEEE International Conference on Microelectronic Test Structures, Long Beach, CA, USA
(Accessed December 12, 2024)
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Test Circuit Structures for Characterizing the Effects of Localized Hot-Carrier-Induced Charge in VLSI Switching Circuits
Published
Author(s)
,
Conference Dates
February 22-23, 1988
Conference Location
Long Beach, CA, USA
Conference Title
IEEE International Conference on Microelectronic Test Structures
Pub Type
Conferences
Citation
Issues
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Created December 30, 1988, Updated October 12, 2021