@conference{754091,
  author = {John Suehle and Kathleen Gallo},
  title = {Test Circuit Structures for Characterizing the Effects of Localized Hot-Carrier-Induced Charge in VLSI Switching Circuits},
  year = {1988},
  month = {1988-12-31 00:12:00},
  publisher = {IEEE  International Conference on Microelectronic Test Structures, Long Beach, CA, USA},
  language = {en},
}