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Techniques for Combinatorial and High-Throughput Microscopy, Part 2: Automated Optical Microscopy Platform for Thin Film Research

Published

Author(s)

Sangcheol Kim, A Sehgal, Alamgir Karim, Michael J. Fasolka
Citation
Techniques for Combinatorial and High-Throughput Microscopy, Part 2: Automated Optical Microscopy Platform for Thin Film Research

Keywords

Combinatorial and THE Methods, Informatics, Microscopy, Thin Films, combinatorial methods, film thickness, gradient libraries, high-throughput materials science, surface energy gradient, temperature gradient, thin films

Citation

Kim, S. , Sehgal, A. , Karim, A. and Fasolka, M. (2003), Techniques for Combinatorial and High-Throughput Microscopy, Part 2: Automated Optical Microscopy Platform for Thin Film Research, Techniques for Combinatorial and High-Throughput Microscopy, Part 2: Automated Optical Microscopy Platform for Thin Film Research, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=853897 (Accessed November 29, 2023)
Created January 1, 2003, Updated February 17, 2017