Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Structural, Electronic, and Dielectric Properties of Ultrathin Zirconia Films on Silicon

Published

Author(s)

Safak Sayan, Nhan V. Nguyen, James R. Ehrstein, Tom Emge, Eric Garfunkel, Mark Croft, X Zhao, David V. Vanderbilt, Ira Levin, Evgeni Gusev, Hyunjung G. Kim
Citation
Applied Physics Letters
Volume
86

Citation

Sayan, S. , Nguyen, N. , Ehrstein, J. , Emge, T. , Garfunkel, E. , Croft, M. , Zhao, X. , Vanderbilt, D. , Levin, I. , Gusev, E. and Kim, H. (2005), Structural, Electronic, and Dielectric Properties of Ultrathin Zirconia Films on Silicon, Applied Physics Letters, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32146 (Accessed February 29, 2024)
Created November 17, 2005, Updated January 27, 2020