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STEM-in-SEM Imaging and Diffraction with Extremely Beam Sensitive Ultrathin Zeolites

Published

Author(s)

Jason Holm
Citation
Microscopy and Microanalysis
Volume
27 (Suppl 1)

Keywords

STEM-in-SEM, transmission SEM, 4D STEM, 2D materials, zeolite

Citation

Holm, J. (2021), STEM-in-SEM Imaging and Diffraction with Extremely Beam Sensitive Ultrathin Zeolites, Microscopy and Microanalysis, [online], https://doi.org/10.1017/S1431927621005833, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=931912 (Accessed November 29, 2021)
Created October 5, 2021