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PUBLICATIONS

STEM-in-SEM Imaging and Diffraction with Extremely Beam Sensitive Ultrathin Zeolites

Published

Author(s)

Jason Holm
Citation
Microscopy and Microanalysis
Volume
27 (Suppl 1)
Pub Type
Journals

Download Paper

https://doi.org/10.1017/S1431927621005833
Local Download

Keywords

STEM-in-SEM, transmission SEM, 4D STEM, 2D materials, zeolite
Materials characterization

Citation

Holm, J. (2021), STEM-in-SEM Imaging and Diffraction with Extremely Beam Sensitive Ultrathin Zeolites, Microscopy and Microanalysis, [online], https://doi.org/10.1017/S1431927621005833, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=931912 (Accessed January 18, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created October 5, 2021, Updated November 29, 2022