TY - JOUR AU - Jason Holm C2 - Microscopy and Microanalysis DA - 2021-10-05 04:10:00 DO - https://doi.org/10.1017/S1431927621005833 LA - en M1 - 27 (Suppl 1) PB - Microscopy and Microanalysis PY - 2021 TI - STEM-in-SEM Imaging and Diffraction with Extremely Beam Sensitive Ultrathin Zeolites UR - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=931912 ER -