Stable Silicon Photodiodes for Absolute Intensity Measurements in the VUV and Soft X-Ray Regions

Published: January 01, 1996

Author(s)

Eric M. Gullikson, R Korde, L R. Canfield, Robert E. Vest
Citation: Journal of Electron Spectroscopy and Related Phenomena
Volume: 80
Pub Type: Journals
Created January 01, 1996, Updated February 17, 2017