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Single Photon Detectors and Metrology

Published

Author(s)

Sonia Buckley, Michelle Stephens, John H. Lehman

Abstract

For quantum applications, it is important to generate quantum states of light and detect them with extremely high efficiency. For future applications, it also important to do this at scale. This presents many engineering and metrology challenges. This paper discusses some of the open challenges and opportunities in single photon detector efficiency measurements, including the challenges of metrology for waveguide-integrated detectors on photonic circuits.
Citation
ECS Transactions
Volume
109
Issue
3

Citation

Buckley, S. , Stephens, M. and Lehman, J. (2022), Single Photon Detectors and Metrology, ECS Transactions, [online], https://doi.org/10.1149/10903.0149ecst, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=935203 (Accessed May 23, 2024)

Issues

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Created October 26, 2022, Updated March 1, 2023