Geist, J.
and Afridi, M.
(2015),
Simulated Sinewave Testing of Data Acquisition Systems using Sine Fitting and Discrete Fourier Transform Methods Part 1: Frequency Offset, Random, Quantization, and Jitter Noise:, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.IR.8073
(Accessed November 1, 2025)
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Simulated Sinewave Testing of Data Acquisition Systems using Sine Fitting and Discrete Fourier Transform Methods Part 1: Frequency Offset, Random, Quantization, and Jitter Noise:
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- NIST IR 8073
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NIST IR 8073
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Created July 1, 2015, Updated February 19, 2025