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Simulated Sinewave Testing of Data Acquisition Systems using Sine Fitting and Discrete Fourier Transform Methods Part 1: Frequency Offset, Random, Quantization, and Jitter Noise:

Published

Author(s)

Jon Geist, M. Yaqub Afridi
Citation
- NIST IR 8073
Report Number
NIST IR 8073

Citation

Geist, J. and Afridi, M. (2015), Simulated Sinewave Testing of Data Acquisition Systems using Sine Fitting and Discrete Fourier Transform Methods Part 1: Frequency Offset, Random, Quantization, and Jitter Noise:, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.IR.8073 (Accessed June 18, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created July 1, 2015, Updated May 20, 2023