TY  - GEN
AU  - Jon Geist
AU  - M. Yaqub Afridi
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2015-07-01 04:07:00
DO  - https://doi.org/10.6028/NIST.IR.8073
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2015
TI  - Simulated Sinewave Testing of Data Acquisition Systems using Sine Fitting and Discrete Fourier Transform Methods Part 1: Frequency Offset, Random, Quantization, and Jitter Noise:
ER  -