@misc{1136051,
  author = {Jon Geist and M. Yaqub Afridi},
  title = {Simulated Sinewave Testing of Data Acquisition Systems using Sine Fitting and Discrete Fourier Transform Methods Part 1: Frequency Offset, Random, Quantization, and Jitter Noise:},
  year = {2015},
  month = {2015-07-01 04:07:00},
  publisher = {, National Institute of Standards and Technology, Gaithersburg, MD},
  doi = {https://doi.org/10.6028/NIST.IR.8073},
  language = {en},
}