Albers, J.
(1992),
Semiconductor Measurement Technology: Version 2.0 of the TXYZ Thermal Analysis Program: TXYZ20, Special Publication (NIST SP), National Institute of Standards and Technology, Gaithersburg, MD
(Accessed February 9, 2026)
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Semiconductor Measurement Technology: Version 2.0 of the TXYZ Thermal Analysis Program: TXYZ20
Published
Author(s)
Citation
Special Publication (NIST SP) -
Volume
400
Issue
89
NIST Pub Series
Pub Type
NIST Pubs
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact [email protected].
Created June 1, 1992, Updated February 17, 2017