Albers, J.
(1992),
Semiconductor Measurement Technology: Version 2.0 of the TXYZ Thermal Analysis Program: TXYZ20, Special Publication (NIST SP), National Institute of Standards and Technology, Gaithersburg, MD (Accessed May 8, 2026)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Semiconductor Measurement Technology: Version 2.0 of the TXYZ Thermal Analysis Program: TXYZ20
Published
Author(s)
Citation
Special Publication (NIST SP) -
Volume
400
Issue
89
NIST Pub Series
Pub Type
NIST Pubs
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact [email protected].
Created June 1, 1992, Updated February 17, 2017