TY  - GEN
AU  - John Albers
C2  - Special Publication (NIST SP), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1992-06-01
LA  - en
M1  - 400
PB  - Special Publication (NIST SP), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1992
TI  - Semiconductor Measurement Technology: Version 2.0 of the TXYZ Thermal Analysis Program: TXYZ20
ER  -