NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.
Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.
An official website of the United States government
Here’s how you know
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Seedless Superfill: Copper Electrodeposition in Trenches with Ruthenium Barriers
Published
Author(s)
Daniel Josell, Daniel Wheeler, C Witt, Thomas P. Moffat
Abstract
Superconformal filling of fine trenches during electrodeposition of copper is described. Copper electrodeposition was accomplished durectly on a ruthenium layer. The ruthenium layer, as well as a titanium layer to promote adhesion, was evaporated on patterned silicon oxide. The electrolyte used was previously shown to yield superconformal feature filling on copper seeded features.
Josell, D.
, Wheeler, D.
, Witt, C.
and Moffat, T.
(2003),
Seedless Superfill: Copper Electrodeposition in Trenches with Ruthenium Barriers, Electrochemical and Solid State Letters, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=853255
(Accessed October 12, 2025)