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Search Publications by: Polette Centellas (Fed)

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Displaying 1 - 3 of 3

Material Needs and Measurement Challenges for Advanced Semiconductor Packaging: Understanding the Soft Side of Science

August 27, 2025
Author(s)
Ran Tao, Polette Centellas, Stian Romberg, Anthony Kotula, Gale Holmes, Amanda Forster, Christopher Soles, Bob Allen, Edvin Cetegen, William Chen, Jeff Gotro, Mark Poliks
This perspective builds upon insights from the National Institute of Standards and Technology (NIST)-organized workshop, "Materials and Metrology Needs for Advanced Semiconductor Packaging Strategies," held at the 35th annual Electronics Packaging

Advanced Metrology Suite for Linking Residual Stress to Fundamental Properties of Thermoset Packaging Materials

June 26, 2025
Author(s)
Polette Centellas, Stian Romberg, Ran Tao, Alexander Landauer, Karl Schoch, Huong Giang Nguyen, Gale Holmes, Gery Stafford, Christopher Soles
Residual stresses inevitably develop in thermosetting materials used for semiconductor packaging during the curing process and in service. Understanding the development of these deleterious stresses is necessary for improving predictive models and

Visualizing Shockwave Interactions and Sub-Catastrophic Damage in Materials via Mechanophores

October 7, 2024
Author(s)
Polette Centellas, Kyle Mehringer, Andrew Bowman, Katherine Evans, Parth Vagholkar, Travis Thornell, Liping Huang, Sarah Morgan, Christopher Soles, Yoan Simon, Edwin Chan
Understanding the physical and chemical response of materials to impulsive deformation is crucial for applications ranging from soft robotic locomotion to space exploration to seismology. However, investigating material properties at extreme strain rates
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