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Search Publications by: Karen DeRocher (Fed)

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Ranging Atom Probe Spectra to Reduce Measurement Bias

July 24, 2024
Author(s)
Frederick Meisenkothen, David Newton, Karen DeRocher, Mark McLean
Atom probe tomography (APT) is emerging as an essential characterization tool in a wide variety of science and engineering fields. For example, APT is helping to foster nascent fields, such as nano-geology [1], and is increasingly being adopted by the
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