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Search Publications by: Karen DeRocher (Fed)

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Displaying 1 - 3 of 3

Wavelength-Dependent Field Ion Emission in Atom Probe Tomography

July 27, 2026
Author(s)
Ann Debay, Benjamin Caplins, Karen DeRocher, Jacob Garcia, May Martin, Mark McLean, Christopher Mead, Luis Miaja Avila, William Osborn, Xiaochen Ren, Norman Sanford
Laser-pulsed atom probe tomography (APT) is a powerful tool for materials characterization due to its desirable combination of high spatial resolution and analytical sensitivity. In current state-of-the-art commercial APT instruments, near ultraviolet (NUV

Ranging Atom Probe Spectra to Reduce Measurement Bias

July 24, 2024
Author(s)
Frederick Meisenkothen, David Newton, Karen DeRocher, Mark McLean
Atom probe tomography (APT) is emerging as an essential characterization tool in a wide variety of science and engineering fields. For example, APT is helping to foster nascent fields, such as nano-geology [1], and is increasingly being adopted by the
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