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Search Publications by: Hans Nembach (Fed)

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Displaying 126 - 133 of 133

Microwave assisted magnetization reversal in single domain nanoelements

July 6, 2009
Author(s)
Hans T. Nembach, Hans Bauer, Justin M. Shaw, Michael Schneider, Thomas J. Silva
We studied the microwave assisted magnetic reversal in 65×71 nm 2 elliptical Ni 80Fe 20 nanomagnets with a thickness of 10 nm. Hysteresis curves were measured by magneto-optical Kerr effect for a range of microwave frequencies and amplitudes. We observe a

Calibrated Broadband Electrical Characterization of Nanowires

June 8, 2008
Author(s)
Thomas Mitchell (Mitch) Wallis, Atif A. Imtiaz, Hans Nembach, Kristine A. Bertness, Norman Sanford, Paul T. Blanchard, Pavel Kabos
A technique is presented for the broadband electrical characterization of nanowires. The technique relies on established on-wafer calibration methods as well as a direct measurement of the capacitive coupling that is in parallel with the nanowire

Near-field microwave microscope measurements to characterize bulk material properties

June 12, 2007
Author(s)
Atif A. Imtiaz, Thomas Baldwin, Hans T. Nembach, Thomas M. Wallis, Pavel Kabos
We measured bulk dielectric (Fused Silica), semiconductor (Silicon) and metal (Copper), with a Near-field Scanning Microwave Microscope (NSMM). We use three bulk materials to test the existing quasi-static theoretical approach to de-embed the materials

Metrology for High-Frequency Nanoelectronics

March 27, 2007
Author(s)
Thomas Mitchell (Mitch) Wallis, Atif A. Imtiaz, Hans Nembach, Paul Rice, Pavel Kabos
Two metrological tools for high frequency measurements of nanoscale systems are described: (i) tow/N-port analysis of nanoscale devices as well as (ii) near-field scanning microwave microscopy (NSMM) for materials characterization. Calibrated two/N-port
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