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Search Publications by: Christopher L. Holloway (Fed)

Displaying 376 - 400 of 431

A Discussion of Losses and Changes in the Characteristic Impedance of Finitely-Conducting Planar Transmission Line Structures

August 19, 2002

Author(s)

Christopher L. Holloway

This paper discusses the effects that finite conductors have on the propagation characteristics of planar transmission lines structures. Closed form expressions for the attenuation constant and the resistance per unit length for various planar structures

Comparison of Planar versus Spherical Emission Meausrements for Unintentional Emitters

August 19, 2002

Author(s)

Perry F. Wilson, Marco Candidi, Christopher L. Holloway

The emission patterns from electrically large objects are complex and require time consuming spherical scans to determine the emissions maximum. A planar cut from the spherical pattern is a relatively easy measurement to make and resembles the techniques

Measurement and Simulation of a Semi-anechoic Room Using Field Mapping as an Indication of Chamber Quality

August 19, 2002

Author(s)

Donna Beals, Christopher L. Holloway, Paul McKenna

In this paper we discuss the use of a field mapping approach for determining chamber quality. Both measurements and simulation results are used to illustrate this approach.

Foreword for Motohisa Kanda's Special Issue

February 1, 2002

Author(s)

Christopher L. Holloway, Perry F. Wilson

This special issue of the IEEE EMC Transactions is in honor of Dr. Motohisa Kanda who passed away on June 12, 2000. Dr. Kanda, known to most of us simply as "Moto," was an important figure within the EMC community and served as Editor of the IEEE EMC

On Determining the Maximum Emissions From Electrically Large Sources

February 1, 2002

Author(s)

Perry F. Wilson, David A. Hill, Christopher L. Holloway

This paper examines the use of measurements of the total radiated power from an arbitrary source, combined with theory-based directivity or quality factor estimates, to accurately predict the maximum electric field radiated by the source either at a line

Time-domain Modeling, Characterization and Measurements of Anechoic and Semi-Anechoic Electromagnetic Test Chambers

February 1, 2002

Author(s)

Christopher L. Holloway, Paul McKenna, Roger Dalke, Rod A. Perala, Charles Devor

In this paper we present time-domain techniques for modeling, characterizing, and measuring anechoic and semi-anechoic chambers used for emission and immunity testing of digital devices. The finite-difference time-domain (FDTD) approach is used to model

An Equivalent Transmission Line Model Containing Dispersion for High Speed Digital Lines

November 1, 2001

Author(s)

Alberto Scarlatti, Christopher L. Holloway

The increase in processor speeds in the last few years has created a growing need for the accurate characterization of waveform propagation on lossy printed circuit board (PCB) transmission lines. In 1980, Gumerova, Efimov and Kostenko introduced an

Transmission-line Parameter Approximation for Digital Simulation

November 1, 2001

Author(s)

Dylan Williams, Christopher L. Holloway

This paper compares closed-form approximations for coplanar waveguide and microstrip transmission-line parameters to accurate measurements and full-wave calculations. We suggest improved approximations and demonstrate the limitations of our proposed and

Meander Delay Line Challenge Problem: A Comparison Using FDTD, FEM and MOM Techniques

August 13, 2001

Author(s)

Alpesh Bhobe, Christopher L. Holloway, Melinda Piket-May

Full wave finite-difference time-domain (FDTD) and a simplified 1D- finite-difference time-domain technique using the multi-conductor transmission line equations are applied to a delay line to determine its propagation characteristics. The output volatge

Emission and Immunity Standards: Replacing Field-at-a-Distance Measurements with Total-Radiated-Power Measurements

August 1, 2001

Author(s)

Perry F. Wilson, Galen H. Koepke, John M. Ladbury, Christopher L. Holloway

The radiation and reception patterns of devices become more complicated as the measurement frequency is increased. These complicated patterns pose a challenge to EMC emission/immunity tests where the direction of maximum radiation/reception needs to be

Modeling Linear and Nonlinear Inductive Effects in Superconductiong Planar Circuits

August 1, 2001

Author(s)

James Booth, Christopher L. Holloway, Edward Kuester

On the Use of Fitting Models for the Time-Domain Analysis of Problems with Frequency-Dependent Parameters

August 1, 2001

Author(s)

Alberto Scarlatti, M. S. Sarto, Christopher L. Holloway

The use of fitting models in the time-domain analysis of electromagnetic problems is of great interest. The aim of this paper is to describe the main features of different fitting models, and the key issues related to their use and practical implementation

Dielectric and Conductor-Loss Characterization and Measurements on Electronic Packaging Materials

July 1, 2001

Author(s)

James R. Baker-Jarvis, Michael D. Janezic, Billy F. Riddle, Christopher L. Holloway, Nicholas Paulter, J Blendell

This is an overview of dielectric measurement methods and metrology on substrate materials used in electronic packaging. These substrates include low-temperature co-fired ceramic, high-temperature co-fired ceramic substrates, printed wiring board, and