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Search Publications by: Keana C. K. Scott (Fed)

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Displaying 26 - 33 of 33

Minimizing damage during FIB-TEM sample preparation of soft materials

November 17, 2011
Nabil Bassim, Bradley De Gregorio, A. D. Kilcoyne, Keana Scott, Tsngming Chou, S. Wirick, George Cody, Rhonda Stroud
Although focused ion beam (FIB) microscopy has been used successfully for milling patterns and creating ultra-thin transmission electron microscopy (TEM) sections of polymers and other soft materials, little has been documented regarding FIB-induced damage

Characterization of SiGe Films for use as a National Institute of Standards and Technology (NIST) Microanalysis Reference material (RM 8905)

February 1, 2010
Ryna B. Marinenko, Shirley Turner, David S. Simons, Savelas A. Rabb, Rolf L. Zeisler, Lee L. Yu, Dale E. Newbury, Rick L. Paul, Nicholas W. Ritchie, Stefan D. Leigh, Michael R. Winchester, Lee J. Richter, Douglas C. Meier, Keana C. Scott, D Klinedinst, John A. Small
Bulk SiGe wafers cut from single-crystal boules and two SiGe thick films (4 m and 5 m thick) on Si wafers were evaluated with the electron probe microanalyzer for the extent of heterogeneity and composition for use as reference materials needed by the

3D Imaging of Diatoms with Ion-abrasion Scanning Electron Microscopy

June 9, 2009
Keana C. Scott, Mark Hildebrand, Sang Kim, Dan Shi, Sriram Subramaniam
Ion-abrasion scanning electron microscopy (IASEM) takes advantage of focused ion beams to abrade thin sections from the surface of bulk specimens, coupled with SEM to image the surface of each section, enabling 3D reconstructions of subcellular

Widefield Light Microscopy Method for High Resolution and Quantum Dot Spectral Studies

January 1, 2007
Cynthia J. Zeissler, Keana C. Scott, Richard D. Holbrook, Peter E. Barker, Yan Xiao
We are exploring methods to achieve 3D 200 nm resolution multispectral imaging with an ordinary inexpensive widefield microscope using incoherent white light sources and an electronically tunable filter. In this work, the capabilities were applied to