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Search Publications by: Keana C. K. Scott (Fed)

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Displaying 26 - 36 of 36

Recent Advances in Focused Ion Beam Technology and Applications

April 11, 2014
Author(s)
Nabil Bassim, Keana C. K. Scott, Lucille A. Giannuzzi
Focused ion beam (FIB) microscopes are extremely versatile and powerful instruments for materials research. These microscopes, when coupled in a system with a scanning electron microscope (SEM), offer the opportunity for novel sample imaging, sectioning

Effects of nanoparticle size and charge on interactions with self-assembled collagen

March 1, 2014
Author(s)
Dongbo Wang, Jing (. Ye, Steven Hudson, Keana Scott, Sheng Lin-Gibson
Recent insights into bone formation have suggested that the critical first step to the biomineralization process is the integration of small (nanometer dimension) mineral clusters into collagen fibers. Such behavior is of intrinsic interest for the areas

Impact of UV Irradiation on the Surface Chemistry and Structure of Multiwall Carbon Nanotube Epoxy Nanocomposites

December 6, 2013
Author(s)
Elijah Petersen, Thomas F. Lam, Justin Gorham, Keana Scott, Chris Long, Deborah Jacobs, Renu Sharma, James Alexander Liddle, Tinh Nguyen
One of the most promising applications of nanomaterials is as nanofillers to enhance the properties of polymeric materials. However, the effect of nanofillers on polymers subject to typical environmental stresses, such as ultraviolet (UV) radiation, high

Minimizing damage during FIB-TEM sample preparation of soft materials

November 17, 2011
Author(s)
Nabil Bassim, Bradley De Gregorio, A. D. Kilcoyne, Keana Scott, Tsngming Chou, S. Wirick, George Cody, Rhonda Stroud
Although focused ion beam (FIB) microscopy has been used successfully for milling patterns and creating ultra-thin transmission electron microscopy (TEM) sections of polymers and other soft materials, little has been documented regarding FIB-induced damage

Characterization of SiGe Films for use as a National Institute of Standards and Technology (NIST) Microanalysis Reference material (RM 8905)

February 1, 2010
Author(s)
Ryna B. Marinenko, Shirley Turner, David S. Simons, Savelas A. Rabb, Rolf L. Zeisler, Lee L. Yu, Dale E. Newbury, Rick L. Paul, Nicholas W. Ritchie, Stefan D. Leigh, Michael R. Winchester, Lee J. Richter, Douglas C. Meier, Keana C. Scott, D Klinedinst, John A. Small
Bulk SiGe wafers cut from single-crystal boules and two SiGe thick films (4 m and 5 m thick) on Si wafers were evaluated with the electron probe microanalyzer for the extent of heterogeneity and composition for use as reference materials needed by the

3D Imaging of Diatoms with Ion-abrasion Scanning Electron Microscopy

June 9, 2009
Author(s)
Keana C. Scott, Mark Hildebrand, Sang Kim, Dan Shi, Sriram Subramaniam
Ion-abrasion scanning electron microscopy (IASEM) takes advantage of focused ion beams to abrade thin sections from the surface of bulk specimens, coupled with SEM to image the surface of each section, enabling 3D reconstructions of subcellular

Widefield Light Microscopy Method for High Resolution and Quantum Dot Spectral Studies

January 1, 2007
Author(s)
Cynthia J. Zeissler, Keana C. Scott, Richard D. Holbrook, Peter E. Barker, Yan Xiao
We are exploring methods to achieve 3D 200 nm resolution multispectral imaging with an ordinary inexpensive widefield microscope using incoherent white light sources and an electronically tunable filter. In this work, the capabilities were applied to
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