U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications by: Frank Heinrich (Assoc)

Search Title, Abstract, Conference, Citation, Keyword or Author
Displaying 26 - 36 of 36

Membrane Association of the PTEN Tumor Suppressor: Molecular Details of the Protein-Membrane Complex from SPR Binding Studies and Neutron Reflection

April 10, 2012
Author(s)
Siddharth Shenoy, Prabhanshu Shekhar, Frank Heinrich, Maria-Claire Daou, Arne Gericke, Alonzo H. Ross, Mathias Loesche
The structure and function of the PTEN phosphatase is investigated by studying its membrance affinity and localization on in-plane fluid, thermally disordered synthetic membrane models. The membrane association of the protein depends strongly on membrane

Molecular Insights into a-Synuclein and Its N-terminal Peptides at the Membrane Interface

February 1, 2012
Author(s)
Candace M. Pfefferkorn, Frank Heinrich, Alexander J. Sodt, Alexander S. Malstev, Richard W. Pastor, Jennifer C. Lee
The role of phospholipids in modulating α-synuclein (α-syn) conformation is of great interest because α-syn aggregation is linked to Parkinson¿s disease. Using a sparsely tethered-bilayer composed of 1:1 molar ratio of 1-palmitoyl-2-oleoyl-sn-glycero-3

Coverage-Dependent Morphology of PEGylated Lysozyme Layers Adsorbed on Silica

January 4, 2012
Author(s)
Sheetal S. Pai, Frank Heinrich, Adam L. Canady, Todd M. Przybycien, Robert D. Tilton
Neutron reflection was used to characterize the adsorbed layer structure for lysozyme conjugated at the N-terminus with a single perdeuterated methoxy poly(ethylene glycol) chain at the silica/water interface. Adsorbed layers were produced with two

Phase-Sensitive Specular Neutron Reflectometry for Imaging the Nanometer Scale Compositional Depth profile of Thin-Film Materials

November 20, 2011
Author(s)
Brian Kirby, Paul A. Kienzle, Brian B. Maranville, Norman F. Berk, J. Krycka, Frank Heinrich, Charles Majkrzak
Neutron reflectometry is a powerful method for probing the molecular scale structure of both hard and soft condensed matter films. Moreover, the phase-sensitive methods which have been developed make it possible for specular neutron reflectometry to be