Phase-Sensitive Specular Neutron Reflectometry for Imaging the Nanometer Scale Compositional Depth profile of Thin-Film Materials
Brian Kirby, Paul A. Kienzle, Brian B. Maranville, Norman F. Berk, J. Krycka, Frank Heinrich, Charles Majkrzak
Neutron reflectometry is a powerful method for probing the molecular scale structure of both hard and soft condensed matter films. Moreover, the phase-sensitive methods which have been developed make it possible for specular neutron reflectometry to be effectively employed as a an imaging device of the composition depth profile of thin film materials with a spatial resolution approaching a fraction of a nanometer. The image of the cross-sectional distribution of matter in the film obtained in such a way can be shown to be, in most cases, unambiguous to a degree limited primarily only by the range and statistical uncertainty of the reflectivity data available. The application of phase-sensitive neutron reflectometry (PSNR) to the study of several types of soft matter thin film systems are illustrated by a number of specific examples from recent studies.
, Kienzle, P.
, Maranville, B.
, Berk, N.
, Krycka, J.
, Heinrich, F.
and Majkrzak, C.
Phase-Sensitive Specular Neutron Reflectometry for Imaging the Nanometer Scale Compositional Depth profile of Thin-Film Materials, Current Opinion in Colloid & Interface Science, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=909601
(Accessed December 7, 2021)