Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications by: Gordon A. Shaw (Fed)

Search Title, Abstract, Conference, Citation, Keyword or Author
Displaying 26 - 50 of 51

Electrochemical Micromachining of Hastelloy B-2 with Ultrashort Voltage Pulses

September 8, 2009
Gordon A. Shaw, Joseph J. Maurer, Steven E. Fick, Thomas P. Moffat, J. J. Mallett, John L. Hudson
Electrochemical micromachining (ECMM) with ultrashort voltage pulses, a maskless all-electrochemical micro and nanofabrication technique, has been used to fabricate microstructures on a corrosion resistant nickel-based superalloy, Hastelloy B-2. Because of

Accurate Picoscale Forces for Insitu Calibration of AFM

September 3, 2009
Koo-Hyun Chung, Gordon A. Shaw, Jon R. Pratt
The force sensitivity of an atomic force microscope is calibrated directly using an in situ realization of primary electrostatic forces ranging from 320 pN to 3.3 nN with accuracy of a few percent. The absolute accuracy of a common atomic force microscope

Methods for transferring the SI unit of force from millinewtons to piconewtons

June 1, 2009
Gordon A. Shaw, Koo-Hyun Chung, Douglas T. Smith, Jon R. Pratt
The establishment of standards for small force measurement requires a link to an absolute measurement of force traceable to the international system of units (SI). To this end, a host of different means are being employed by the NIST small force

Contactless Differential Conductivity Detection

October 12, 2008
Gordon A. Shaw, David J. Ross, Steven E. Fick, Wyatt N. Vreeland
We propose a new technique, contactless differential conductivity detection (CDCD,) to improve the detection limit of contactless conductivity detection for capillary and microchannel electrophoresis. By exploiting a 3-electrode differential configuration

A New Microdevice for SI-Traceable Forces in Atomic Force Microscopy

June 2, 2008
Gregory W. Vogl, Jason J. Gorman, Gordon A. Shaw, Jon R. Pratt
A new self-excited micro-oscillator is proposed as a velocity standard for dissemination of nanoNewton-level forces that are traceable to the International System of Units (SI). The microfabricated oscillator is top-coated with magnetic thin films and

Reducing Thermal Noise in Molecular Force Spectroscopy

June 2, 2008
Gordon A. Shaw
Molecular force spectroscopy is the practice of testing the mechanical properties of single molecules. The precision determination of these properties requires an instrument capable of piconewton-level force measurement. The atomic force microscope (AFM)

Spring constant calibration of AFM cantilevers with a piezosensor transfer standard

September 24, 2007
Eric Langlois, Gordon A. Shaw, John A. Kramar, Jon R. Pratt, Donna C. Hurley
We describe a method to calibrate the spring constants of cantilevers for atomic force microscopy (AFM). The method makes use of a piezosensor comprised of a piezoresistive cantilever and accompanying electronics. The piezosensor was calibrated before use

Direct Electrostatic Calibration of Hybrid Sensors for Small Force Measurement

June 4, 2007
Koo-Hyun Chung, Gordon A. Shaw, Jon R. Pratt
The measurement of forces from piconewtons to millinewtons is an area of interest from both an applied and pure research standpoint, however creating a link between small forces and the International System of Units (SI) has been difficult. In this work, a

Traceable Micro-Force Sensor for Instrumented Indentation Calibration

April 10, 2007
Douglas T. Smith, Gordon A. Shaw, R M. Seugling, D Xiang, Jon R. Pratt
Instrumented indentation testing (IIT), commonly referred to as nanoindentation when small forces are used, is a popular technique for determining the mechanical properties of small volumes of material. Sample preparation is relatively easy, usually

A Piezoresistive Cantilever Force Sensor for Direct AFM Force Calibration

April 8, 2007
Jon R. Pratt, John A. Kramar, Gordon A. Shaw, Douglas T. Smith, John M. Moreland
We describe the design, fabrication, and calibration testing of a new piezoresistive cantilever force sensor suitable for the force calibration of atomic force microscopes in a range between tens of nanonewtons to hundreds of micronewtons. The sensor is

The Stiffness of Collagen Fibrils Influences Vascular Smooth Muscle Cell Phenotype

March 1, 2007
Dennis P. McDaniel, Gordon A. Shaw, John T. Elliott, Kiran Bhadriraju, Curtis W. Meuse, Koo-Hyun Chung, Anne L. Plant
Cells receive signals from the extracellular matrix through receptor-dependent interactions, but they are also influenced by the mechanical properties of the matrix. While bulk properties of substrates have been shown to effect cell behavior, we show here

Traceable Micro-Force Calibration for Instrumented Indentation Testing

February 13, 2007
Douglas T. Smith, Gordon A. Shaw, Richard Seugling, Jon R. Pratt, Dan Xiang
We describe the development, performance and application of an accurate SI-traceable force calibration and verification system for potential use in the field calibration of commercial instrumented indentation testing (IIT) instruments. The system consists

Force Calibration Via Electrostatics

January 1, 2006
Jon R. Pratt, John A. Kramar, Gordon A. Shaw, Lee Kumanchik
We describe the electrical and length measurements necessary to realize micronewton forces in a fashion consistent with the International System of Units (SI). We first discuss instrumentation and procedures required to accurately characterize an

New Reference Standards and Artifacts for Nanoscale Physical Property Characterization

January 1, 2006
Jon R. Pratt, John A. Kramar, Gordon A. Shaw, Richard S. Gates, Paul Rice, John M. Moreland
This paper provides an overview of calibration artifacts being developed at the National Institute of Standards and Technology (NIST) that are intended to aid the accurate determination of nanoscale physical properties across a broad range of applications

Use of Transfer Artifacts for Small Force Measurement

January 1, 2006
Gordon A. Shaw, Jon R. Pratt, Richard S. Gates, Mark Reitsma
In order for the atomic microscope (AFM) to be used in truly quantatitive studies, a basis within the international system of units (SI) must be established. In order to do this, the microfabricated cantilevers typically used for AFM force measurements

Mechanical Stability of Collagen Fibril Networks

November 1, 2005
Gordon A. Shaw, Dennis P. McDaniel, John T. Elliott, Alessandro Tona, Anne L. Plant
Thin films of type 1 collagen fibril networks fabricated on alkanethiol-functionalized surfaces have been previously shown to provide an excellent protein matrix for cultured cells in applications such as drug toxicity studies and studies of cell signaling

Development of Traceable Small Force Standards

June 1, 2005
Gordon A. Shaw, Jon R. Pratt
Although instrumented indentation and atomic forcve microscope (AFM) are utilized extensively for the measurement of forces in the piconewton to millinewton regime, accurate calibration of these forces remains an obstacle to quantitative research

Incoporating Process Planning into Conceptual Design

September 1, 1999
Shaw C. Feng, Gordon A. Shaw, Walter W. Nederbragt, Serge Kaing, Ram D. Sriram
This paper describes recent developments in the Design and Process Planning Integration (DPPI) project at the National Institute of Standards and Technology (NIST). The project addresses the need for improved communication between design and process