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Search Publications by: Joshua M. Pomeroy (Fed)

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Displaying 76 - 100 of 142

Highly charged ion (HCI) modified tunnel junctions

August 15, 2008
Author(s)
Joshua M. Pomeroy, Holger Grube
The neutralization energy carried by highly charged ions (HCIs) provides a fundamentally independent method for localizing energy on a target’s surface, producing features and modifying surfaces with fluences and kinetic energies that are negligible for

Spectra of W 39+ -W 47+ in the 12 nm to 20 nm Region Observed With an EBIT Light Source

October 14, 2007
Author(s)
Yuri Ralchenko, Joseph Reader, Joshua M. Pomeroy, Joseph N. Tan, John D. Gillaspy
We observed spectra of highly ionized tungsten in the extreme ultraviolet with an electron beam ion trap (EBIT) and a grazing incidence spectrometer at the National Institute of Standards and Technology. Stages of ionization were distinguished by varying

The Potential of Highly Charged Ions: Possible Future Applications

September 1, 2007
Author(s)
John D. Gillaspy, Joshua M. Pomeroy, A C. Perrella, Holger Grube
This paper mirrors and provides references to an invited review talk delivered by the first author at the 13th International Conference on the Physics of Highly Charged Ions. It briefly updates and extends an earlier review given in 2001 [1].

Selectable Resistance-Area Product by Dilute Highly Charged Ion Irradiation

August 13, 2007
Author(s)
Joshua M. Pomeroy, Holger Grube, A C. Perrella, John D. Gillaspy
In order to provide high performance read heads for future hard drive densities, considerable effort worldwide has been invested in developing techniques for producing low resistance area product (RA) magnetic tunnel junction sensors. In this letter, we

Gold Nanostructures Created by Highly Charged Ions

June 28, 2007
Author(s)
Joshua M. Pomeroy, Holger Grube, A C. Perrella, John D. Gillaspy
Nanometer sized structures produced by individual highly charged ion (HCI)impacts are reported for the first time on a high conductivity surface andexamined by scanning tunnelling microscopy (STM). Highly charged ions, e.g.,Bi$^{81+}$, represent an exotic

EUV Spectroscopy of Highly Charged Xenon Ions Created Using an Electron Beam Ion Trap

March 27, 2007
Author(s)
K Fahy, E Sokell, G O'Sullivan, A Aguilar, Joshua M. Pomeroy, Joseph N. Tan, John D. Gillaspy
At the NIST Electron Beam Ion Trap (EBIT), extreme-ultraviolet spectra of xenon ions have been recorded using a flat-field spectrometer. The electron beam energy was varied from 180 eV to 8 keV and radiation from charge states Xe6+ to Xe43+ was observed