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Displaying 26 - 30 of 30

AFM characterization of nanopositioner in-plane stiffnesses

August 19, 2010
Author(s)
Seung Ho Yang, Yong Sik Kim, Premsagar P. Kavuri, Jae M. Yoo, Young M. Choi, Nicholas G. Dagalakis
A versatile method for measurement of in-plane stiffness of micro-elements was developed and its usefulness has been demonstrated. The in-plane stiffness of a NIST nanopositioner has been measured directly using a colloidal probe in an AFM without any

Nanoparticle size and shape evaluation using the TSOM optical microscopy method

June 6, 2010
Author(s)
Ravikiran Attota, Richard J. Kasica, Lei Chen, Premsagar P. Kavuri, Richard M. Silver, Andras Vladar
We present a novel optical TSOM (through-focus scanning optical microscopy - pronounced as 'tee-som') method that produces nanoscale dimensional measurement sensitivity using a conventional optical microscope. The TSOM method uses optical information from

Elastic Modulus of Faceted Aluminum Nitride Nanotubes Measured by Contact Resonance Atomic Force Microscopy

December 17, 2008
Author(s)
Gheorghe Stan, C Ciobanu, Timothy Thayer, George Wang, Randall Creighton, Premsagar P. Kavuri, Leonid A. Bendersky, Robert F. Cook
A new methodology for determining the radial elastic modulus of a one-dimensional nanostructure laid on a substrate has been developed. The methodology consists of the combination of contact resonance atomic force microscopy (AFM) with finite element
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