U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications by: Paul Kienzle (Fed)

Search Title, Abstract, Conference, Citation, Keyword or Author
Displaying 1 - 15 of 15

Structural Investigations of Membrane-Associated Proteins by Neutron Reflectometry

July 1, 2019
Author(s)
Rebecca Eells, David Hoogerheide, Paul A. Kienzle, Mathias Loesche, Charles Majkrzak, Frank Heinrich
Neutron reflectometry is a powerful technique for probing the structure of lipid bilayer membranes and membrane-associated proteins. Measurements of the specular neutron reflectivity as a function of momentum transfer can be performed in aqueous

Optimization of Reflectometry Experiments using Information Theory

February 1, 2019
Author(s)
Bradley W. Treece, Paul A. Kienzle, David Hoogerheide, Charles Majkrzak, Mathias Loesche, Frank Heinrich
A method based on Bayesian statistics and information theory is developed to analyze the information gain Δ}H of surface-sensitive reflectometry experiments. After presenting the underlying mathematical framework and its implementation, the method is

reductus: A Stateless Python Data-Reduction Service with a Browser Frontend

October 1, 2018
Author(s)
Brian B. Maranville, William D. Ratcliff, Paul A. Kienzle
The online data reduction service reductus transforms measurements in experimental science from laboratory coordinates into physically meaningful quantities with accurate estimation of uncertainties based on instrumental settings and properties. This

Nanolayer Analysis by Neutron Reflectometry

July 18, 2017
Author(s)
Joseph A. Dura, Eric Daniel Rus, Paul Kienzle, Brian B. Maranville
Neutron reflectometry offers unique benefits for nanolayer research in green chemistry by providing accurate depth profiles of thin films and interfaces with sub-nanometer precision under in operando condition of active material in their native

Bayesian Method for the Analysis of Diffraction Patterns using BLAND

December 1, 2016
Author(s)
Joseph E. Lesniewski, Steven M.T. Disseler, Dylan J. Quintanta, Paul A. Kienzle, William D. Ratcliff
Rietveld refinement of x-ray and neutron diffraction patterns is routinely used to solve crystal and magnetic structures of organic and inorganic materials over many length scales. Despite its success over the last several decades, conventional Rietveld

Measurement and Modeling of Polarized Specular Neutron Reflectivity in Large Magnetic Fields

August 1, 2016
Author(s)
Brian B. Maranville, Brian J Kirby, Alexander J Grutter, Paul Kienzle, Charles F. Majkrzak, Yaohua Liu, Cindi L. Dennis
The presence of a large applied magnetic field removes the degeneracy of the vacuum energy states for spin-up and spin-down neutrons. For polarized neutron reflectometry, this must be included in the reference potential energy of the Schrodinger equation

Spatial Evolution of the Ferromagnetic Phase Transition in an Exchange Graded Film

January 29, 2016
Author(s)
Brian J. Kirby, H. F. Belliveau, D. D. Belyea, Paul A. Kienzle, Alexander J. Grutter, P. Riego, A. Berger, Casey W. Miller
A combination of experiments and numerical modeling was used to study the spacial evolution of the ferromagnetic phase transition in a thin film engineered to have a smooth gradient in exchange strength, and thus effectively a gradient in local transition

Phase Segregation of Sulfonate Groups in Nafion Interface Lamellae, Quantified via Neutron Reflectometry Fitting Techniques for Multi-Layered Structures

August 21, 2014
Author(s)
Steven C. DeCaluwe, Paul A. Kienzle, Pavan Bhargava, Andrew M. Baker, Joseph Dura
Neutron reflectometry analysis methods are developed and used to determine the composition depth profile in cases where the structure is no known a priori. These methods, including statistical methods, sophisticated fitting routines, and coupling multiple

Phase-Sensitive Small-Angle Neutron Scattering

April 1, 2014
Author(s)
Charles F. Majkrzak, Kathryn L. Krycka, Susan Krueger, Norman F. Berk, Paul A. Kienzle, Brian B. Maranville
A method is described for determining the neutron scattering length density distribution of a molecular scale object directly from phase-sensitive small angle neutron scattering (SANS). The structure factor amplitude is obtained through the use of a

Phase-Sensitive Specular Neutron Reflectometry for Imaging the Nanometer Scale Compositional Depth profile of Thin-Film Materials

November 20, 2011
Author(s)
Brian Kirby, Paul A. Kienzle, Brian B. Maranville, Norman F. Berk, J. Krycka, Frank Heinrich, Charles Majkrzak
Neutron reflectometry is a powerful method for probing the molecular scale structure of both hard and soft condensed matter films. Moreover, the phase-sensitive methods which have been developed make it possible for specular neutron reflectometry to be

Vertically Graded Anisotropy in Co/Pd Multilayers

March 8, 2010
Author(s)
Brian J. Kirby, Joseph E. Davies, Kai Liu, Shannon Watson, G. T. Zimanyi, Robert D. Shull, Paul A. Kienzle, Julie A. Borchers
It has been theoretically predicted that depth-grading the magnetic anisotropy in perpendicular magnetic media should reduce the field required to write data, without affecting the thermal stability. To study this prediction, we have produced a series of