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Search Publications by: Sergey Mekhontsev (Assoc)

Displaying 51 - 56 of 56

Monte Carlo Modeling of an Integrating Sphere Reflectometer

January 1, 2003

Author(s)

Leonard M. Hanssen, Sergey Mekhontsev, Alexander Prokhorov

Reciprocity Principle and the Choice of Reflectance Model for Physically Correct Modeling of Effective Emissivity

January 1, 2003

Author(s)

Leonard M. Hanssen, Sergey Mekhontsev, Alexander Prokhorov

Low Scatter Optical System for Emittance and Temperature Measurements

October 1, 2002

Author(s)

Sergey Mekhontsev, Leonard M. Hanssen

The development and evaluation of an optical system for a new spectral directional emittance facility at NIST is reported. The imaging quality and signal contributions due to out-of-field-of-view scattering, commonly characterizedby the size-of-source

Reciprocity Principle and Choice of the Reflectance Model for Physically Correct Modeling of Effective Emissivity

August 17, 2002

Author(s)

A Prokhorov, Leonard Hanssen, Sergey Mekhontsev

In the last two decades considerable Progress has been made in numerical modeling of isothermal and non-isothermal cavities by the Monte Carlo method, in particular, by the use of the uniform specular-diffuse reflection model and backward ray tracing

Evaluation of Performance of Integrating Spheres for Indirect Emittance Measurement

July 1, 2002

Author(s)

A Prokhorov, Sergey Mekhontsev, Leonard Hanssen

Integrating sphere reflectometers are used in the majority of instruments used for spectral reflectance measurements of non-specular (scattering) samples. Knowledge of directional-hemispherical spectral reflectance (and transmittance, in the case of semi

Fourier Transform System for Characterization of Infrared Spectral Emittance of Materials

June 1, 2001

Author(s)

Leonard M. Hanssen, Simon G. Kaplan, Sergey Mekhontsev

To meet the existing demand for measurements of emittance of opaque and semi-transparent materials, a new facility is being built at NIST around a bench-top Fourier spectrometer. This facility will complement existing capabilities for characterization of

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