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Search Publications by: Uwe Arp (Fed)

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Displaying 101 - 125 of 172

Tomography of Integrated Circuit Interconnects

October 1, 2001
Author(s)
Zachary H. Levine, A R. Kalukin, M Kuhn, S P. Frigo, I McNulty, C C. Retsch, Y Wang, Uwe Arp, Thomas B. Lucatorto, Bruce D. Ravel, Charles S. Tarrio
00 Word summary based on the paper:Z. H. Levine, A. R. Kalukin, M. Kuhn, S. P. Frigo, I. McNulty,>C. C. Retsch, Y. Wang, U. Arp, T. B. Lucatorto, B. D. Ravel, and C. Tarrio,>``Microtomography of Integrated Circuit Interconnect with an> Electromigration

Elimation of Intensity Noise at SURF III

August 1, 2001
Author(s)
Uwe Arp, K Harkay, K Kim, Thomas B. Lucatorto
Most applications of synchrotron radiation are not very sensitive to source intensity fluctuations. Fourier-transform spectroscopy, however, is very sensitive to intensity noise with frequencies of few Hz to several kHz. An infrared spectrometer installed

Spontaneous Coherent Microwave Emission and the Sawtooth Instability in a Compact Storage Ring

May 1, 2001
Author(s)
Uwe Arp, Gerald T. Fraser, Angela R. Hight Walker, Thomas B. Lucatorto, K K. Lehmann, K Harkay, N Sereno, K Kim
Strong evidence for self-excited emission of coherent synchrotron radiation in the microwave spectral region was observed at the Synchrotron Ultraviolet Radiation Facility SURF III electron storage ring at the National Institute of Standards and Technology

SURF III - An Improved Storage Ring for Radiometry

October 1, 2000
Author(s)
Uwe Arp, R Friedman, Mitchell L. Furst, Susan L. Makar, Ping-Shine Shaw
The National Institute of Standards and Technology (NIST) operates the newly upgraded Synchrotron Ultraviolet Radiation Facility (SURF III) mainly as a light source for radiometry. SURF III provides continuum radiation from the far infrared to the soft X

Selected Programs at the New SURF III Electron Storage Ring

June 1, 2000
Author(s)
Mitchell L. Furst, Uwe Arp, G P. Cauchon, A D. Hamilton, L R. Hughey, Thomas B. Lucatorto, Charles S. Tarrio
The conversion of the electron storage ring at NIST (the National Institute of Standards and Technology) to SURF III (the Synchrotron Ultraviolet Radiation Facility) has resulted in a significant improvement to the azimuthal uniformity of magnetic field as

Tomography of Integrated Circuit Interconnect With an Electromigration Void

May 1, 2000
Author(s)
Zachary H. Levine, A R. Kalukin, M Kuhn, S P. Frigo, I McNulty, C C. Retsch, Y Wang, Uwe Arp, Thomas B. Lucatorto, Bruce D. Ravel, Charles S. Tarrio
An integrated circuit interconnect was subject to accelerated-life conditions to induce an electromigration void. The silicon substrate was removed, leaving only the interconnect encased test structure encased in silica. We imaged the sample with 1750 eV

Characterization of Materials Using an Ultraviolet Radiometric Beamline at SURF III

January 1, 2000
Author(s)
Ping-Shine Shaw, R Gupta, Thomas A. Germer, Uwe Arp, Thomas B. Lucatorto, Keith R. Lykke
The completion of the upgrade of the synchrotron facilities at the National Institute of Standards and Technology (NIST) has yielded a better-characterization broadband source of ultraviolet (UV) radiation at the Synchrotron Ultraviolet Radiation Facility