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Diffraction and Depths-of-Field Effects in Electron Beam Imaging at SURF III

Published

Author(s)

Uwe Arp

Abstract

Imaging an electron beam with visible light is a common method of diagnostics applied to electron accelerators. It is a straightforward way to deduce the transverse electron distribution as well as its changes over time. The electrons stored in the Synchrotron Ultraviolet Radiation Facility (SURF) III at the National Institute of Standards and Technology (NIST) were studied over an extended period of time to characterize the upgraded accelerator. There is good agreement between experimental and theoretical horizontal beam sizes at three different electron energies.
Citation
Nuclear Instruments & Methods in Physics Research Section A-Accelerators Spectrometers Detectors and Associated Equipment
Volume
462
Issue
No. 3

Keywords

depth of field, diffraction, electron beam diagnostics, storage ring, synchrotron radiation, tranverse beam size

Citation

Arp, U. (2001), Diffraction and Depths-of-Field Effects in Electron Beam Imaging at SURF III, Nuclear Instruments & Methods in Physics Research Section A-Accelerators Spectrometers Detectors and Associated Equipment (Accessed May 27, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created April 1, 2001, Updated February 17, 2017