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Publications

Search Publications by Jennifer R Verkouteren

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Displaying 1 - 25 of 38

Emerging techniques for the detection of pyrotechnic residues from seized postal packages containing fireworks

January 24, 2020
Author(s)
John G. Gillen, Thomas Forbes, Jennifer R. Verkouteren, Shannon T. Krauss, Karlijn Bezemer, Arian C. van Asten, Peter J. Shoenmakers, Mattijs Koeberg
High volume screening of parcels with the aim to trace the illegal distribution and selling of fireworks using postal services is challenging. Inspection services have limited manpower and means to perform extensive visual inspection. In this study, the

Discriminative potential of ion mobility spectrometry for the detection of fentanyl and fentanyl analogues relative to confounding environmental interferents

September 27, 2019
Author(s)
Thomas P. Forbes, Jeffrey A. Lawrence, Jennifer R. Verkouteren, R M. Verkouteren
The opioid crisis and emergence of fentanyl, fentanyl analogues, and other synthetic opioids has highlighted the need for sensitive and robust detection for interdiction at screening points, notably vehicles at border crossings and packages at postal

A Standards and Measurement Infrastructure for Calibration, Verification and Optimization of Trace Explosives Detection Systems

April 15, 2019
Author(s)
John G. Gillen, Jennifer R. Verkouteren, R M. Verkouteren, Marcela N. Najarro, Edward R. Sisco, Matthew E. Staymates, Jessica L. Staymates, Robert A. Fletcher, Jeffrey A. Lawrence, Elizabeth L. Robinson, Alexander T. Bulk, Joseph A. Bennett, Shinichiro Muramoto, Thomas P. Forbes
Current national priorities in homeland security have led to an unprecedented level of utilization of explosives trace detection (ETD) systems for counterterrorism and law enforcement. Despite the widespread deployment of ETD instruments at airports

Rapid Detection of Fentanyl, Fentanyl Analogues, and Opioids for on-Site or Laboratory Based Drug Seizure Screening using Thermal Desorption DART-MS and Ion Mobility Spectrometry

April 27, 2017
Author(s)
Edward R. Sisco, Jennifer R. Verkouteren, Jessica L. Staymates, Jeffrey A. Lawrence
Fentanyl and fentanyl analogues represent a current and emerging threat in the United States as pure illicit narcotics and as cutting agents with heroin. Because of their extreme potency, methods to safely and rapidly detect these compounds are of high

Standardized Measurements of Collection Efficiency from Wipe-Sampling of Trace Explosives

April 10, 2017
Author(s)
Jennifer R. Verkouteren, Jeffrey A. Lawrence, Matthew E. Staymates, Edward R. Sisco
One of the limiting steps to detecting traces of explosives at screening venues is effective collection of the sample. Wipe-sampling is the most common procedure for collecting traces of explosives, and standardized measurements of collection efficiency

Particle Fabrication Using Inkjet Printing onto Hydrophobic Surfaces for Optimization and Calibration of Trace Contraband Detection Sensors

November 24, 2015
Author(s)
John G. Gillen, Marcela N. Najarro, Matthew E. Staymates, Scott A. Wight, Marlon L. Walker, Jennifer R. Verkouteren, Eric S. Windsor, Aaron A. Urbas
A method has been developed to fabricate patterned arrays of micrometer-sized monodisperse solid particles of ammonium nitrate on hydrophobic silicon surfaces using inkjet printing. The method relies on dispensing one or more microdrops (typically 50 pL

Pressure-Sensitive Sampling Wands for Homeland Security Applications

December 1, 2013
Author(s)
Matthew E. Staymates, Jennifer R. Verkouteren, Jessica Grandner
This work discusses the use of Force Sensing Resistor (FSR) technology for Homeland Security applications. One area of particular focus is the optimization of wipe sampling of surfaces to facilitate enhanced trace contraband collection. Another focus area

Automated Mapping of Explosives Particles in Composition C-4 Fingerprints

March 1, 2010
Author(s)
Jennifer R. Verkouteren, Jessica L. Staymates, Inho Cho
A method is described to perform automated mapping of RDX particles in C-4 fingerprints. The method employs polarized light microscopy and image analysis to map the entire fingerprint and the distribution of RDX particles. The approach is relatively quick

Method to Determine Collection Efficiency of Particles by Swipe Sampling

September 1, 2008
Author(s)
Jennifer R. Verkouteren, Jessica L. Staymates, Robert A. Fletcher, Wayne Smith, George A. Klouda, John G. Gillen
A methodology was developed to evaluate particle collection efficiencies from swipe sampling of trace residues. Swipe sampling is used for many applications where trace residues must be collected, including the evaluation of radioactive particle

NIST Program to Support Testing and Evaluation of Trace Explosive Detection

October 1, 2007
Author(s)
R M. Verkouteren, John G. Gillen, Jennifer R. Verkouteren, Robert A. Fletcher, Eric S. Windsor, Wayne Smith
Trace detection is a primary strategy for thwarting terrorism activities in the US and abroad. The development of effective reference materials and methods for this purpose relies on fundamental knowledge regarding the size, mass, morphologies, and

Verification of a Gas Mask Calibrant

February 19, 2007
Author(s)
Robert A. Fletcher, Jiann C. Yang, George W. Mulholland, R L. King, Michael R. Winchester, D Klinedinst, Jennifer R. Verkouteren, Thomas G. Cleary, David Buckingham, James J. Filliben

Depth Profiling Using C 60 + SIMS Deposition and Topography Development During Bombardment of Silicon

July 30, 2006
Author(s)
John G. Gillen, J Batteas, Chris A. Michaels, P Chi, John A. Small, Eric S. Windsor, Albert J. Fahey, Jennifer R. Verkouteren, W Kim
A C60+ primary ion source has been coupled to an ion microscope SIMS instrument to examine sputtering of silicon with an emphasis on possible application of C60+ depth profiling for high depth resolution SIMS analysis of silicon semiconductor materials

New Guidelines for d13C Measurements

April 1, 2006
Author(s)
T Coplen, W A. Brandt, M Gehre, Manfred Groning, HAJ Meijer, Blaza Toman, Jennifer R. Verkouteren
Consistency of 13C measurements can be improved 39-47% by anchoring the 13C scale with two isotopic referencematerials differing substantially in 13C/12C. It isrecommended that 13C values of both organic andinorganic materials be measured and expressed

IMS-Based Trace Explosives Detectors for First Responder Use

September 1, 2005
Author(s)
Jennifer R. Verkouteren, John G. Gillen, R M. Verkouteren, Robert A. Fletcher, E S. Etz, George A. Klouda, Alim A. Fatah, Philip J. Mattson
The purpose of this document is to establish minimum performance requirements and an associated test method for Ion Mobility Spectrometry (IMS) based trace explosives detectors for use by the first responder community. Information concerning the theory and

Automated Analysis of Organic Particles Using Cluster SIMS

June 1, 2004
Author(s)
John G. Gillen, Cynthia J. Zeissler, Christine M. Mahoney, Abigail P. Lindstrom, Robert A. Fletcher, P Chi, Jennifer R. Verkouteren, David S. Bright, R Lareau, M Boldman
Cluster primary ion bombardment combined with secondary ion imaging is used in an ion microscope secondary ion mass spectrometer for the spatially resolved analysis of organic particles on various surfaces. Compared to the use of monoatomic primary ion

Bevel Depth Profiling SIMS for Analysis of Layer Structures

September 1, 2003
Author(s)
John G. Gillen, Scott A. Wight, P Chi, Albert J. Fahey, Jennifer R. Verkouteren, Eric S. Windsor, D. B. Fenner
We are evaluating the use of bevel depth profiling Secondary Ion Mass Spectrometry (SIMS) for the characterization of layered semiconductor materials. In this procedure, a sub-degree angle bevel is cut into the analytical sample with an oxygen or cesium