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Displaying 1 - 20 of 20

Characterization of Chemical Properties, Unit Cell Parameters and Particle Size Distribution of Three Zeolite Reference Materials: RM 8850 - Zeolite Y, RM 8851 - Linde Type A Zeolite and RM 8852 - Ammonium ZSM-5 Zeolite

April 4, 2017
Author(s)
Shirley Turner, Robert A. Fletcher, Eric S. Windsor, Jennifer R. Verkouteren, John R. Sieber, Thomas W. Vetter, Rolf L. Zeisler, Anthony F. Marlow, M E. Davis, G J. Kennedy, W S. Borghard, S Yang, A Navrotsky, B H. Toby, James F. Kelly, Stefan D. Leigh
Zeolites have important industrial applications including use as catalysts, molecular sieves and ion exchange materials. In this study, three zeolite materials have been characterized by the National Institute of Standards and Technology (NIST) as

Characterization of SiGe Films for use as a National Institute of Standards and Technology (NIST) Microanalysis Reference material (RM 8905)

February 1, 2010
Author(s)
Ryna B. Marinenko, Shirley Turner, David S. Simons, Savelas A. Rabb, Rolf L. Zeisler, Lee L. Yu, Dale E. Newbury, Rick L. Paul, Nicholas W. Ritchie, Stefan D. Leigh, Michael R. Winchester, Lee J. Richter, Douglas C. Meier, Keana C. Scott, D Klinedinst, John A. Small
Bulk SiGe wafers cut from single-crystal boules and two SiGe thick films (4 m and 5 m thick) on Si wafers were evaluated with the electron probe microanalyzer for the extent of heterogeneity and composition for use as reference materials needed by the

Electron Microprobe Characterization of Si-Ge Alloys and Films for Use as Microanalysis Reference Materials

October 16, 2008
Author(s)
Ryna B. Marinenko, Shirley Turner, Dale E. Newbury, Robert L. Myklebust, Lee L. Yu, Rolf L. Zeisler, David S. Simons, John A. Small
Bulk SiGe wafers cut from single-crystal boules and SiGe thick films on Si wafers were evaluated with the electron probe microanalyzer for the extent of heterogeneity and composition for use as reference standards needed by the microelectronics industry in

Restructuring of Tungsten Thin Films Into Nanowires and Hollow Square Cross-Section Microducts

November 1, 2005
Author(s)
P. M. Parthangal, Richard E. Cavicchi, Christopher B. Montgomery, Shirley Turner, Michael R. Zachariah
We report on the growth of nanowires and unusual hollow microducts of tungsten by thermal treatment of tungsten films in a RF H2/Ar plasma at temperatures between 550-620 C. Nanowires with diameters of 10-30 nm and lengths between 50-300 nm were formed

Characterization of SiGe Bulk Compositional Standards with Electron Probe Microanalysis

September 1, 2003
Author(s)
Ryna B. Marinenko, J T. Armstrong, Shirley Turner, Eric B. Steel, F A. Stevie
Bulk SiGe wafers cut from single-crystal boules were evaluated with the electron probe microanalyzer (EPMA) for micro- and macroheterogeneity for use as primary standards for future characterization of SiGe thin films on Si that are needed by the