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Search Publications by: Eric Simmon (Fed)

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Displaying 26 - 49 of 49

RoHS Harmonization - Progress Toward a Single Global Standard?

July 13, 2007
Author(s)
Eric D. Simmon
The lack of global harmonization of RoHS initiatives has been a major headache for the electronics industry, to say the least. A number of organizations have been working very diligently to move standards closer together, with the hope that at some point

Environmental Regulations Impose New Product Lifecycle Information Requirements

July 1, 2007
Author(s)
John V. Messina, Eric D. Simmon, Matthew L. Aronoff
In a global response to increasing health and environmental concerns, there has been a trend towards governments enacting legislation to encourage sustainable manufacturing where industry creates products that minimize environmental impact. This

North American Environmental Compliance Attitudes Towards Electronics

June 6, 2007
Author(s)
Krista Botsford, John V. Messina, Eric D. Simmon
More and more countries are beginning eco-compliance legislation for electronics products. Where does the USA stand? This paper will discuss the following areas and attitudes towards environmental compliance in the USA: levels of legislation, who is (or

Focus 3D Telemodeling Tool: GUI Design for Iteration 1

September 28, 2006
Author(s)
Matthew L. Aronoff, John V. Messina, Eric D. Simmon
The Focus 3D Telemodeling Tool was designed as a novel graphical interface to data modeling for standards development. This paper describes the design intent for the proposed Graphical User Interface (GUI) of Focus -- how users interact with the system and

Simple UML Modeling to Improve the Development of Information Standards

September 24, 2005
Author(s)
Eric D. Simmon, John V. Messina, Arthur Griesser
Streamlining and Bulletproofing the Standards Development Process In the increasingly complex semiconductor fabrication environment capturing and transferring information throughout the product development cycle is critical. As the process of creating

Implementing Electronic Materials Data Exchange

August 18, 2005
Author(s)
Eric D. Simmon, Arthur Griesser
Adding automation to your materials declaration process will set, simplify, and streamline the materials declaration process. Whether your company is a component supplier, board manufacturer or assembly services company, the structure of how you manage

Software Interoperability: Enabling New Technologies

May 19, 2005
Author(s)
John V. Messina, Matthew L. Aronoff, Eric D. Simmon
New and potentially disruptive technologies are constantly being introduced into the electronic interconnection industry as companies seek to improve their manufacturing chain and stay competitive. These new technologies do not exist in a vacuum and must

Measuring the Performance of XML-Based Data Standards

September 23, 2004
Author(s)
Eric D. Simmon, Gino Crispieri
The semiconductor fabrication plant floor is a constantly changing environment. As equipment and fabrication process complexity increases, larger quantities of data are being generated, transferred and processed. New data encoding standards are being

Users' Guide to the NIST-High-Voltage Capacitance Ratio Bridge

March 28, 2001
Author(s)
Eric D. Simmon, Gerald FitzPatrick, O. Petersons
This TechNote has been written as a guide to the operation of and applications for the NIST Capacitor Ratio Bridge (CRB). The theory, design, and operating principles of the CRB, sources of measurement error, and principal applications are discussed in

Calibration of Dissipation Factor Standards

April 1, 1999
Author(s)
Eric D. Simmon, Gerald FitzPatrick, O. Petersons
Working standards for dissipation factor (D) standards obtained by connecting a shielded three-terminal capacitor in series with a shielded precision resistor have been developed for calibration purposes. Precision conductance boxes have been built for use

Calibration of Dissipation Factor Standards

July 1, 1998
Author(s)
Eric D. Simmon, Gerald FitzPatrick, O. Petersons
Dissipation factor (D) standards obtained by connecting a shielded three-terminal capacitor in series with a shielded resistor have been developed for calibration purposes. An analysis of these DF Standards, including precautions in their construction and

Evaluation of High-Voltage Impulse Waveforms Using Model-Based Deconvolution

June 1, 1998
Author(s)
Gerald FitzPatrick, Eric D. Simmon, J. Lagnese
Accurate measurement of high voltage (hv) impulse waveforms is of critical importance in the testing of hv apparatus and for fundamental insulation studies. Quantifying the measurement system errors can be performed by following procedures recommended by

Use Case Based Testing Applied to Smart Grid Development

Author(s)
Eric D. Simmon, Arthur Griesser
The US Power delivery system is being updated by grafting an intelligent, decision making network to the existing grid. If designed correctly, this smart grid will ensure that the power grid can meet our needs in the coming century. This paper discusses a