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Search Publications by: Craig M. Shakarji (Fed)

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Displaying 51 - 55 of 55

Validation of CMM Task Specific Measurement Uncertainity Software

August 1, 2003
Author(s)
M P. Henke, J M. Baldwin, K Summerhays, B Rasnick, P Murray, Daniel S. Sawyer, Bruce R. Borchardt, Steven D. Phillips, Craig M. Shakarji
Task specific CMM measurement uncertainty statements can be generated using computer (Monte Carlo) simulation. REcently, commercial products using this powerful technique have become available; however they typically involve megabytes of code inaccessible

The Validation of CMM Task Specific Measurement Uncertainty Software

January 1, 2003
Author(s)
Steven D. Phillips, Bruce R. Borchardt, A Abackerli, Craig M. Shakarji, Daniel S. Sawyer, P Murray, B Rasnick, K Summerhays, J M. Baldwin, M P. Henke
Task specific CMM measurement uncertainty statements can be generated using computer (Monte Carlo) simulation. Recently, commercial products using this powerful technique have become available; however they typically involve megabytes of code inaccessible

Information Technology Measurement and Testing Activities at NIST

February 1, 2001
Author(s)
David Flater, James E. Fowler, Simon P. Frechette, Craig M. Shakarji, Michael Hogan, Shirley M. Radack, Douglas Montgomery, L Johnson, R Rosenthal, R Mccabe, R Carpenter, Lisa Carnahan, M M. Gray
Our high technology society continues to rely more and more upon sophisticated measurements, technical standards, and associated testing activities. This was true for the industrial society of the 20th century and remains true for the information society

Information Technology Measurement and Testing Activities at NIST

January 1, 2001
Author(s)
Michael D. Hogan, Lisa J. Carnahan, Robert J. Carpenter, David W. Flater, James E. Fowler, Simon P. Frechette, M M. Gray, L A. Johnson, R. McCabe, Douglas C. Montgomery, Shirley M. Radack, R Rosenthal, Craig M. Shakarji
Our high technology society continues to rely more and more upon sophisticated measurements, technical standards, and associated testing activities. This was true for the industrial society of the 20th century and remains true for the information society

Least-Squares Fitting Algorithms of the NIST Algorithm Testing System

December 1, 1998
Author(s)
Craig M. Shakarji
This report describes algorithms for fitting certain curves and surfaces to points in three dimensions. All fits are based on orthogonal distance regression. The algorithms were developed as reference software for the NIST Algorithm Testing System, which
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