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Search Publications by: Lee J Richter (Assoc)

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Displaying 276 - 300 of 300

Scanning Near-Field Infared Microscopy and Spectroscopy with a Broadband Laser Source

October 1, 2000
Author(s)
Chris A. Michaels, Lee J. Richter, Richard R. Cavanagh, Stephan J. Stranick
Near-field scanning optical microscopy (NSOM) is a powerful tool for the characterization of the optical properties of nanoscale objects, although pervasive artifacts often create difficulties in image interpretation. A three dimensional scanning NSOM

Scanning Near-Field Infrared Microscopy and Spectroscopy With a Broadband Laser Source

October 1, 2000
Author(s)
Chris A. Michaels, Stephan J. Stranick, Lee J. Richter, Richard R. Cavanagh
A scanning near-field microscopy that allows the fast acquisition of mid-infrared absorption spectra is described. The microscope couples the nanoscale spatial resolution of a scanning probe microscope with the chemical specificity of vibrational

Assessment of Sensitivity Advances in Near-Field Raman Spectroscopy

September 1, 2000
Author(s)
Chris A. Michaels, C E. Dentinger, Lee J. Richter, D B. Chase, Richard R. Cavanagh, Stephan J. Stranick
Near-field Raman spectroscopy can be used to obtain images with both chemical specificity and the subwavelength spatial resolution of near-field scanning optical microscopy (NSOM). In the absence of signal intensification factors, such as surface

Influence of Secondary Tip Shape on Illumination-Mode Near-Field Scanning Optical Microscopy Images

August 1, 1999
Author(s)
Lee J. Richter, C E. Dentinger, Richard R. Cavanagh, Garnett W. Bryant, A Liu, Stephan J. Stranick, C D. Keating, M J. Natan
We report illumination-mode near-field optical microscopy images of individual 80-115 nm diameter Au particles recorded with metal-coated fiber probes. It is found that the images are strongly influenced by the metal-coating thickness. This dependence is

Nanoscale Chemical Imaging With Scanning Near-Field Infrared Microscopy

June 1, 1999
Author(s)
Chris A. Michaels, Stephan J. Stranick, Lee J. Richter, Richard R. Cavanagh
The development of a near-field microscope that utilizes infrared absorption as the optical contrast mechanism will be described. This instrument couples the nanoscale spatial resolution of a scanning probe microscope with the chemical specificity of

Vibrationally-Resolved Sum-Frequency Generation With Broad Bandwidth Infrared Pulses

October 15, 1998
Author(s)
Lee J. Richter, T Petralli-Mallow, John C. Stephenson
We present a novel procedure for vibrationally-resolved sum-frequency generation (SFG) in which a broad-bandwidth IR pulse is mixed with a narrow-bandwidth visible pulse. The resultant SFG spectrum is dispersed with a spectrograph and detected in parallel

High Efficiency, Dual Collection Mode Near-Field Scanning Optical Microscope

July 1, 1998
Author(s)
Stephan J. Stranick, Lee J. Richter, Richard R. Cavanagh
We have developed a near-field scanning optical microscope that provides simultaneous transmission and reflection mode measurements while concurrently recording a topograph of the sample surface. In this microscope design, an ellipsoidal cavity is used to
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