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Search Publications by: Charles J Glinka (Assoc)

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Displaying 1 - 14 of 14

Sub-Millisecond Time-Resolved Small-Angle Neutron Scattering Measurements at NIST

June 3, 2020
Charles J. Glinka, Markus NMN Bleuel, Peter NMN Tsai, Dominika Zakutna, Dirk Honecker, Dominique Dresen, Flore Mees, Sabrina Disch
Instrumentation for sub-millisecond time-resolved SANS measurements at the National Institute of Standards and Technology (NIST) is described and applied to the reorientation dynamics of elongated hematite nanoparticles. Instrumentation for time-resolved

Comparison of Pinhole Collimation and Focusing Optics for SANS

September 21, 2015
Charles J. Glinka, John G. Barker, David F. Mildner
We examine quantitatively the instrumental factors that affect the theoretical performance and practical application of conventional pinhole collimation and focusing optics for Small-Angle Neutron Scattering (SANS) measurements. We calculate the relative

Kinetic Pathway of the Bilayered-Micelle to Perforated-Lamellae Transition

June 1, 2003
Haonan Wang, M P. Nieh, Erik K. Hobbie, Charles J. Glinka, J Katsaras
Near-edge x-ray absorption fine structure (NEXAFS) spectroscopy was used to meausre simultaneously the relaxation rates of polystyrene (PS) molecules at the free surface and in the bulk. The samples were uniaxially stretched and annealed at temperatures

Materials Research With Neutrons at NIST

February 1, 2001
Ronald L. Cappelletti, Charles J. Glinka, Susan T. Krueger, Richard M. Lindstrom, Jeffrey W. Lynn, Henry J. Prask, E Prince, John J. Rush, J. Michael Rowe, Sushil K. Satija, B H. Toby, A. Tsai, Terrence J. Udovic

Abstracts for the MSEL Assessment Panel, March 2001

January 26, 2001
Leslie E. Smith, Alamgir Karim, Leonid A. Bendersky, C Lu, J J. Scott, Ichiro Takeuchi, Kathleen M. Flynn, Vinod K. Tewary, Davor Balzar, G A. Alers, Stephen E. Russek, Charles C. Han, Haonan Wang, William E. Wallace, Daniel A. Fischer, K Efimenko, Wen-Li Wu, Jan Genzer, Joseph C. Woicik, Thomas H. Gnaeupel-Herold, Henry J. Prask, Charles F. Majkrzak, Norman F. Berk, John G. Barker, Charles J. Glinka, Eric K. Lin, Ward L. Johnson, Paul R. Heyliger, David T. Read, R R. Keller, J Blendell, Grady S. White, Lin-Sien H. Lum, Eric J. Cockayne, Igor Levin, C E. Johnson, Maureen E. Williams, Gery R. Stafford, William J. Boettinger, Kil-Won Moon, Daniel Josell, Daniel Wheeler, Thomas P. Moffat, W H. Huber, Lee J. Richter, Clayton S. Yang, Robert D. Shull, R A. Fry, Robert D. McMichael, William F. Egelhoff Jr., Ursula R. Kattner, James A. Warren, Jonathan E. Guyer, Steven P. Mates, Stephen D. Ridder, Frank S. Biancaniello, D Basak, Jon C. Geist, Kalman D. Migler
Abstracts relating to research and development in the NIST Materials Science and Engineering Laboratory (MSEL) are presented for a poster session to be presented to the 2001 MSEL Assessment Panel.