Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications by: J Greg Gillen (Fed)

Displaying 101 - 110 of 110

UV Photopatterning of Alkanethiolate Monolayers Self-Assembled on Gold and Silver

June 1, 1993

Author(s)

Michael J. Tarlov, Donald R. Burgess Jr., J Greg Gillen

Compositional Changes in Aluminum-Lithium-Base Alloys Caused by Oxidation

January 1, 1993

Author(s)

K K. Soni, D. V. Williams, Dale Newbury, J Greg Gillen, P. Chi, David S. Bright

Doped Gelatin Films as a Model Matrix for Molecular Secondary Ion Mass-Spectrometry Studies of Biological Soft-Tissue

January 1, 1993

Author(s)

John G. Gillen, S.M. Hues

Formation and Emission of Tetraalkylammonium Salt Molecular-Ions Sputtered from a Gelatin Matrix

January 1, 1993

Author(s)

John G. Gillen, J. Bennett

High Dynamic Range SIMS Depth Profiling on In Situ Ion-beam-generated Mesas Using the Ion Microscope

July 1, 1992

Author(s)

John G. Gillen

Localization of Labeled Compounds in Human Hair Using SIMS

June 5, 1992

Author(s)

John G. Gillen, Cynthia J. Zeissler

The Use of Kinetic-Engergy Distributions to Determine the Relative Contributions of Gas-Phase and Surface Fragmentation in Kiloelectronvolt Ion Sputtering of an Quaternary Ammonium Salt

April 15, 1991

Author(s)

John G. Gillen

Image Depth Profiling SIMS: An evaluation for the analysis of light element diffusion for the analysis of light element diffusion in YBa2 Cu3O7-x single-crystal superconductors

January 1, 1991

Author(s)

John G. Gillen, Debra L. Kaiser, Jay S. Wallace

Molecular Ion Imaging and Dynamic Secondary Ion Mass Spectrometry Analysis of Organic Compounds

January 1, 1990

Author(s)

John G. Gillen, David S. Simons, P. Williams

An ion microscope equipped with a resistive anode encoder imaging system has been used to acquire molecular secondary ion images, with lateral resolutions on the order of 1 μm, from several quaternary ammonium salts an amino acid, and a polynuclear

Secondary Ion Yield Matrix Effects in SIMS Depth Profiles of Si/Ge Multilayers

April 1, 1989

Author(s)

John G. Gillen, J M. Phelps, Randall W. Nelson, Peter Williams, Steven M. Hues

Thin multilayer samples of Si/Ge, with individual layer thicknesses of 4-33 nm, have been analyzed by secondary ion mass spectrometry (SIMS) using Ar+, O2+ and Cs+ primary ion beams. Bombardment with both Ar+ and O2+ produced positive secondary ion depth