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Search Publications by: Norman F Berk (Assoc)

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Displaying 1 - 10 of 10

The Effect of Transverse Wavefront Width on Specular Neutron Reflection

August 1, 2022
Charles Majkrzak, Norman F. Berk, Brian B. Maranville, Joseph Dura, Terrence J. Jach
In the analysis of neutron scattering measurements of condensed matter structure, it normally suffices to treat the incident and scattered neutron beams as if composed of incoherent distributions of plane waves with wavevectors of different magnitudes and

Phase-Sensitive Small-Angle Neutron Scattering

April 1, 2014
Charles F. Majkrzak, Kathryn L. Krycka, Susan Krueger, Norman F. Berk, Paul A. Kienzle, Brian B. Maranville
A method is described for determining the neutron scattering length density distribution of a molecular scale object directly from phase-sensitive small angle neutron scattering (SANS). The structure factor amplitude is obtained through the use of a

Determination of the Effective Transverse Coherence of the Neutron Wave Packet as Employed in Reflectivity Investigations of Condensed-Matter Structures. I. Measurements

March 27, 2014
Charles F. Majkrzak, Christopher Metting, Brian B. Maranville, Joseph A. Dura, Sushil K. Satija, Terrence J. Udovic, Norman F. Berk
The primary purpose of this investigation is to determine the effective coherent extent of the neutron wave packet transverse to its mean propagation vector k, as prepared in a typical instrument used to study the structure of materials in thin film form

Phase-Sensitive Specular Neutron Reflectometry for Imaging the Nanometer Scale Compositional Depth profile of Thin-Film Materials

November 20, 2011
Brian Kirby, Paul A. Kienzle, Brian B. Maranville, Norman F. Berk, J. Krycka, Frank Heinrich, Charles Majkrzak
Neutron reflectometry is a powerful method for probing the molecular scale structure of both hard and soft condensed matter films. Moreover, the phase-sensitive methods which have been developed make it possible for specular neutron reflectometry to be

Multiple Small-Angle Neutron Scattering Studies of Anisoptropic Materials

December 1, 2002
Andrew J. Allen, Norman F. Berk, J Ilavsky, Gabrielle G. Long
Various authors have recognized the power of multiple small-angle neutron scattering (MSANS) analysis in providing information on coarse, concentrated microstructures involving micrometer length-scales larger than are accessible in conventional small-angle

Abstracts for the MSEL Assessment Panel, March 2001

January 26, 2001
Leslie E. Smith, Alamgir Karim, Leonid A. Bendersky, C Lu, J J. Scott, Ichiro Takeuchi, Kathleen M. Flynn, Vinod K. Tewary, Davor Balzar, G A. Alers, Stephen E. Russek, Charles C. Han, Haonan Wang, William E. Wallace, Daniel A. Fischer, K Efimenko, Wen-Li Wu, Jan Genzer, Joseph C. Woicik, Thomas H. Gnaeupel-Herold, Henry J. Prask, Charles F. Majkrzak, Norman F. Berk, John G. Barker, Charles J. Glinka, Eric K. Lin, Ward L. Johnson, Paul R. Heyliger, David T. Read, R R. Keller, J Blendell, Grady S. White, Lin-Sien H. Lum, Eric J. Cockayne, Igor Levin, C E. Johnson, Maureen E. Williams, Gery R. Stafford, William J. Boettinger, Kil-Won Moon, Daniel Josell, Daniel Wheeler, Thomas P. Moffat, W H. Huber, Lee J. Richter, Clayton S. Yang, Robert D. Shull, R A. Fry, Robert D. McMichael, William F. Egelhoff Jr., Ursula R. Kattner, James A. Warren, Jonathan E. Guyer, Steven P. Mates, Stephen D. Ridder, Frank S. Biancaniello, D Basak, Jon C. Geist, Kalman D. Migler
Abstracts relating to research and development in the NIST Materials Science and Engineering Laboratory (MSEL) are presented for a poster session to be presented to the 2001 MSEL Assessment Panel.