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NIST Authors in Bold

Displaying 801 - 825 of 74084

Interpretation and Report Writing in Forensic Comparisons of Paint Evidence: An Inter-laboratory Exercise

June 21, 2023
Author(s)
Donna J. Sirk, Andria Mehltretter, Meghan Prusinowski, Hal Arkes, David Flohr, Cedric Neumann, Scott Ryland, Tatiana Trejos
This interlaboratory study evaluated a guide for interpreting and reporting trace evidence examinations. The online survey aimed to assess the examiners' interpretation of casework scenarios designed by a subject matter expert panel (SMEP), specifically

Quantum-limited optical time transfer for future geosynchronous links

June 21, 2023
Author(s)
Emily Caldwell, Jean-Daniel Deschenes, Jennifer Ellis, William C. Swann, Benjamin Stuhl, Hugo Bergeron, Nathan R. Newbury, Laura Sinclair
The combination of optical time transfer and optical clocks opens up the possibility of large-scale free-space networks that connect both ground-based optical clocks and future space-based optical clocks. Such networks promise better tests of general

2022 NIST Summary of U.S. Legal Metrology Activities

June 20, 2023
Author(s)
Lisa Warfield, Tina G. Butcher, Richard A. Harshman, Jan Konijnenburg, Gloria Diane Lee, David Sefcik, Juana Williams, Katrice Lippa
The NIST Office of Weights and Measures (OWM) presents its first report 2022 NIST Annual Summary of U.S. Legal Metrology Activities report. This report includes a summary of changes made to NIST Handbook 44 (2021) Specifications, Tolerances and Other

Procedure Overhaul at the NIST Center for Neutron Research

June 19, 2023
Author(s)
Brandy Frie, David Griffin, James R. Whipple
The National Institute of Standards and Technology (NIST) Center for Neutron Research operates a 20 MW research reactor whose primary purpose is to produce cold neutrons for material sciences experiments. On February 3rd, 2021, a fuel element was unlatched

What limits the voltage of GaAs photovoltaic devices under low indoor light?

June 19, 2023
Author(s)
Behrang Hamadani, Margaret Stevens, Matthew Lumb, Kenneth Schmieder
The external radiative efficiency of a photovoltaic device is a useful metric to compare different photovoltaic technologies and material systems. However, under low-intensity indoor lighting, a particular open-circuit voltage dependence arises that cannot

Alternative Reflectors for The NIST Neutron Source

June 18, 2023
Author(s)
Yaniv Shaposhnik, Osman Celikten, Jeremy Cook, Abdullah Weiss, Dagistan Sahin
A conceptual design of a replacement reactor at the NIST Center for Neutron Research (NCNR), referred to as the NIST Neutron Source (NNS), is underway in collaboration with the Brookhaven National Laboratory. The NNS reactor design favors the production of

Lessons Learned on NBSR Licensing Actions

June 18, 2023
Author(s)
Dagistan Sahin, Thomas H. Newton, Steven Dewey, Osman Celikten, Paul C. Brand, Lap-Yan Cheng
After the incident in February 2021, NBSR implemented three license amendment requests (LAR) to allow the restart of the reactor. The first LAR was to modify previous latch verification requirements in the Technical Specifications (TS). Originally TS

A non-defect precursor gate oxide breakdown model

June 16, 2023
Author(s)
Kin (Charles) Cheung
Understanding defect creation is central to efforts to comprehend gate dielectric breakdown in metal-oxide-semiconductor-field-effect-transistors (MOSFETs). While gate dielectrics other than SiO2 are now popular, models develop for SiO2 breakdown are used

Status Report on the Final Round of the NIST Lightweight Cryptography Standardization Process

June 16, 2023
Author(s)
Meltem Sonmez Turan, Kerry McKay, Donghoon Chang, Jinkeon Kang, Noah Waller, John M. Kelsey, Lawrence E. Bassham, Deukjo Hong
The National Institute of Standards and Technology (NIST) initiated a public standardization process to select one or more Authenticated Encryption with Associated Data (AEAD) and hashing schemes suitable for constrained environments. In February 2019, 57

DATA REQUIREMENTS FOR DIGITAL TWINS IN ADDITIVE MANUFACTURING

June 15, 2023
Author(s)
Shaw C. Feng, Albert T. Jones, Guodong Shao
The number and types of sensors used to monitor additive manufacturing (AM) processes and parts in real time are growing. The emerging digital twins (DTs) associated with the data collected by those sensors and the functions that use that data as inputs

Direct Visualization of Chemically Resolved Multilayered Domains in Mixed-Linker Metal-Organic Frameworks

June 15, 2023
Author(s)
Andrea Centrone, Belen Lerma-Berlanga, Adam Biacchi, Carmen Fernandez Conde, Georges Pavlidis, Carlos Marti-Gastaldo
The modular synthesis approach for assembling inorganic nodes and organic multidentate linkers into reticular solids enables rational engineering in porous materials known as metal-organic frameworks (MOFs). Incorporation of two or more linker types in MOF

Evaluation Methods and Measurement Challenges for Industrial Exoskeletons

June 15, 2023
Author(s)
Ya-Shian Li-Baboud, Ann Virts, Roger Bostelman, Soocheol Yoon, Amaan Rahman, Lucia Rhode, Nishat Ahmed, Mili Shah
In recent years, exoskeleton test methods for industrial exoskeletons have evolved to include simulated laboratory and field environments. Physiological, kinematic and kinetic metrics, as well as subjective surveys are used to evaluate exoskeleton

Studies of spatial uniformity and jitter in SiC UV SPADs

June 15, 2023
Author(s)
Joshua Bienfang, Edwin J. Heilweil, Anand Sampath, Gregory Garrett, Jonathan Shuster, Jeremy Smith, Michael Derenge, Daniel Habersat, Reza Gandhi, Sergei Dolinsky, Enrico Bellotti, michael wrabeck
Ultraviolet single-photon avalanche detectors (UV-SPAD) that are low cost, size, weight, and power as well as resilient to shock, high temperatures and stray magnetic fields have a number of applications. SiC is attractive for UV SPADs as it is inherently

Visualizing the melting of the charge density wave in UTe2 by generation of pairs of topological defects with opposite winding

June 15, 2023
Author(s)
Anuva Aishwarya, Julian May-Mann, Avior Almoalem, Sheng Ran, Shanta Saha, Johnpierre Paglione, Nicholas Butch, Eduardo Fradkin, Vidya Madhavan
Topological defects are singularities in an ordered phase that can have a profound effect on phase transitions and serve as a window into the order parameter. In this work we use scanning tunneling microscopy to visualize the role of topological defects in
Displaying 801 - 825 of 74084