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Displaying 1826 - 1850 of 4225

Modeling the Peak Cutting Temperature During High-Speed Machining of AISI 1045 Steel

May 22, 2012
Author(s)
Timothy J. Burns, Steven P. Mates, Richard L. Rhorer, Eric P. Whitenton, Debasis Basak
This paper presents new experimental data on AISI 1045 steel from the NIST pulse-heated Kolsky Bar Laboratory. The material is shown to exhibit a stiffer response to compressive loading when it has been rapidly preheated, than it does when it has been

Contour Metrology using Critical Dimension Atomic Force Microscopy

April 9, 2012
Author(s)
Ndubuisi G. Orji, Ronald G. Dixson, Andras Vladar, Bin Ming, Michael T. Postek
The critical dimension atomic force microscope (CD-AFM), which is used as a reference instrument in lithography metrology, has been proposed as a supplemental instrument for contour measurement and verification. However, although data from CD-AFM is

On CD-AFM bias related to probe bending

April 9, 2012
Author(s)
Vladimir A. Ukraintsev, Ndubuisi George Orji, Theodore V. Vorburger, Ronald G. Dixson, Joseph Fu, Richard M. Silver
Critical Dimension AFM (CD-AFM) is a widely used reference metrology. To characterize modern semiconductor devices, very small and flexible probes, often 15 nm to 20 nm in diameter, are now frequently used. Several recent publications have reported on

Ground Truth for Evaluating 6 Degrees of Freedom Pose Estimation Systems

March 28, 2012
Author(s)
Jeremy Marvel, Joseph Falco, Tsai H. Hong
Systems developed to estimate poses of objects in 6 degrees of freedom (6DOF) Cartesian space (X, Y, and Z coordinates plus roll, pitch, and yaw) are reliant on the vendors' own processes to determine performance and measurement accuracy. These practices

2011 Solutions in Perception Challenge Performance Metrics and Results

March 22, 2012
Author(s)
Jeremy Marvel, Tsai H. Hong, Elena R. Messina
The 2011 Solutions in Perception Challenge (SPC) presented an international collection of teams with the opportunity to develop algorithms that could positively identify and accurately locate in space an arbitrary collection of artifacts. Researchers at

Emergency Response Robot Evaluation Exercise

March 22, 2012
Author(s)
Adam S. Jacoff, Hui-Min Huang, Ann Virts, Anthony Downs, Raymond Sheh
More than 60 robot test methods are being developed by a team lead by the National Institute of Standards and Technology (NIST) with the sponsorship of U.S. Department of Homeland Security (DHS). These test methods are being specified and standardized

Functional Requirements of a Model for Kitting Plans

March 22, 2012
Author(s)
Stephen B. Balakirsky, Zeid Kootbally, Thomas R. Kramer, Rajmohan Madhavan, Craig I. Schlenoff, Michael O. Shneier
Industrial assembly of manufactured products is often performed by first bringing parts together in a kit and then moving the kit to the assembly area where the parts are used to assemble products. Kitting, the process of building kits, has not yet been
Displaying 1826 - 1850 of 4225
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